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The current state of high resolution scanning electron microscopy*

Published online by Cambridge University Press:  17 March 2009

A. V. Crewe
A. V. Crewe
Affiliation:
Department of Physics and Enrico Fermi Institute, University of Chicago
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Extract

It has been known for many years that there are two distinct ways of designing an electron microscope.

Type
Research Article
Information
Quarterly Reviews of Biophysics , Volume 3 , Issue 1 , February 1970 , pp. 137 - 175
Copyright
Copyright © Cambridge University Press 1970

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References

Archard, G. D. (1955). Two new simplified systems for the correction of spherical aberration in electron lenses. Proc. phys. Soc. 68 B, 156.CrossRefGoogle Scholar
Archard, G. D. (1958). An unconventional electron lens. Proc. phys. Soc. 72, 1355.CrossRefGoogle Scholar
Broers, A. N. (1968). High brightness electron gun using a field emission cathode. Proc. 26th A. Mtg E.M.S.A., 1968, p. 294.Google Scholar
Butler, J. W. (1966). Digital computer techniques in electron microscopy. Proc. 6th Int. Congr. for E.M. (Kyoto) 1, 191.Google Scholar
Cosslett, V. E. (1965). Possibilities and limitations for the differentiation of elements in the electron microscope. Quantitative Electron Microscopy, Ed. Bahr, G. F. and Zeitler, E.. Baltimore: Williams and Wilkins. Also Plural and Multiple Scattering of Electrons, 1 p. 762.Google Scholar
Cosslett, V. E. & Haine, M. E. (1954). The tungsten point cathode as an electron source. Proc. 3rd Int. Conf. on E.M., London, 1954, p. 639.Google Scholar
Crewe, A. V. (1969). Closing the gap—a 5 Å scanning microscope. Proc. 27th A. Mtg E.M.S.A., 1969, p. 6.Google Scholar
Crewe, A. V. (1968). The potentials of scanning microscopy. Proc. 26th A. Mtg E.M.S.A., 1968, p. 352.Google Scholar
Crewe, A. V., Eggenberger, E. N., Wall, J. & Welter, L. M. (1968). An electron gun using a field emission source. Rev. Scient. Instrum. 39, 576.CrossRefGoogle Scholar
Crewe, A. V., Johnson, D. & Isaacson, M. (1968). An electron gun scanning microscope. Proc. 26th A. Mtg E.M.S.A., 1968, p. 360.Google Scholar
Crewe, A. V., Johnson, D. & Isaacson, M. (1969). Secondary electron detection in a field emission scanning microscope. Proc. 27th A. Mtg E.M.S.A., 1969, p. 16.Google Scholar
Crewe, A. V., Isaacson, M. & Johnson, D. (1969 a). A high performance energy analyzer for use in electron scanning microscopy. Proc. 27th A. Mtg E.M.S.A., 1969, p. 14.Google Scholar
Crewe, A. V., Isaacson, M. & Johnson, D. (1969 b). A simple scanning electron microscope. Rev. scient. Instrum. 40, 241.CrossRefGoogle Scholar
Crewe, A. V. & Wall, J. (1969 a). Contrast in a high resolution scanning transmission electron microscope. Optik (In the Press).Google Scholar
Crewe, A. V. & Wall, J. (1969 b). High resolution scanning microscopy. Proc. 27th A. Mtg E.M.S.A., 1969, p. 172.Google Scholar
Crewe, A. V.Wall, J. & Welter, L. M. (1968 a). A high resolution scanning microscope. Proc. 26 A. Mtg E.M.S.A., 1968, p. 356.Google Scholar
Crewe, A. V., Wall, J. & Welter, L. M. (1968 b). High resolution scanning transmission electron microscopy, J. appl. Phys. 39, 5861.CrossRefGoogle Scholar
Deltrap, J. H. (1964). Correction of spherical aberration of electronic lenses. Ph.D. thesis, Cambridge University.Google Scholar
deRosier, D. L. & Klug, A. (1968). Reconstruction of three dimensional structures from electron micrographs. Nature, Lond. 217, 130.CrossRefGoogle Scholar
Durandeau, P. & Fert, C. (1957). Lentilles electroniques magnetiques. Revue Opt. théor. instrum. 36, 205.Google Scholar
Goldmark, P. C. & Hollywood, J. M. (1951). A new technique for improving the sharpness of television pictures. Proc. Inst. Radio Engrs 39, 1314.Google Scholar
Gomer, R. (1961). Field Emission and Field Ionisation. Harvard University Press.Google Scholar
Grigson, C. W. B. (1965). Improved scanning electron diffraction system. Rev. scient. Instrum. 36, 1587.CrossRefGoogle Scholar
Grivet, P. (1965). Electron Optics. New York: Pergamon Press.Google Scholar
Hayes, T. L., Glaeser, R. M. & Pawley, J. B. (1969). Information content of electron microscope images: color and depth information as vehicles for subjective information transfer. Proc. 27th A. Mtg E.M.S.A., 1969, p. 410.Google Scholar
Johnson, D. & Moriearty, P. (1969). Examination of schistosome cercariae and schistosomules by scanning electron microscopy. Proc. 27th A. Mtg E.M.S.A., 1969, p. 50.Google Scholar
Knoll, M. (1935). Aufladepotential und dekundaremission elektronenbestrahlter korper. Z. tech. Phys. 16, 467.Google Scholar
Knoll, M. & Ruska, E. (1932). Contribution to geometric electron optics. Annls. Phys. 12, 607.CrossRefGoogle Scholar
Knoll, M. & Theile, R. (1939). Elektronenabtaster zur strukturabbildung von oberflachen und dunnen schichten. Z. tech. Phys. 113, 260.Google Scholar
Kovasznay, L. S. G. & Joseph, H. M. (1955). Image processing. Proc. Inst. Radio Engrs 43, 560.Google Scholar
Oatley, C. W., Nixon, W. C. & Pease, R. F. W. (1965). Scanning electron microscopy. Adv. Electronics Electron. Phys. 21, 181.CrossRefGoogle Scholar
Pease, R. F. W. & Nixon, W. C. (1965). High resolution scanning electron microscopy. J. scient. Instrum. 42, 81.CrossRefGoogle Scholar
Rossi, F. (1969). Black and white and color image tone enhancement in scanning electron microscopy. Proc. 27th A. Mtg E.M.S.A., 1969, p. 86.Google Scholar
Ruska, E. (1966). Past and present attempts to attain the resolution limit of the transmission electron microscope. Adv. Optical Electron Microsc. 1, 116.Google Scholar
Septier, A. (1968). The struggle to overcome spherical aberration in electron optics. Adv. Optical Electron Microsc. 1, 204.Google Scholar
Smith, K. C. A. & Oatley, C. W. (1955). The scanning electron microscope and its fields of application. Br. J. appl. Phys. 6, 391.CrossRefGoogle Scholar
Thomson, M. G. R. & Crewe, A. V. (1968). The possibility of improving scanning microscope images by after-treatment. Proc. 26th A. Mtg E.M.S.A., 1968, p. 358.Google Scholar
Ardenne, M. von (1938). Prinzip und theorie des elektronen-rastermikroskopes. Z. tech. Phys. 109, 533.Google Scholar
Borries, B. Von & Ruska, E. (1939). Aufbau und leistung des diemens ubermikroskops. Z. wiss. Mikrosk. 56, 317.Google Scholar
Wiesner, J. C. & Everhart, T. E. (1969). Point cathode electron sources. Proc. 27th A. Mtg E.M.S.A., 1969, p. 174.Google Scholar
Zeitler, E. & Thomson, M. G. R. (1969). The theoretical contrast in scanning and conventional high resolution microscopes. Proc. 27th A. Mtg E.M.S.A., 1969, p. 170.Google Scholar
Zworykin, V. K., Hillier, J. & Snyder, R. L. (1942). Scanning electron microscope. A.S.T.M. Bull. 117, 15.Google Scholar