Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T22:18:44.108Z Has data issue: false hasContentIssue false

Abundance Analysis for Extremely Metal-Poor Stars from SDSS/SEGUE

Published online by Cambridge University Press:  02 August 2018

T. Matsuno
Affiliation:
Department of Astronomical Science, SOKENDAI, Tokyo 181-8588, Japan National Astronomical Observatory of Japan, Tokyo 181-8588, Japan
W. Aoki
Affiliation:
Department of Astronomical Science, SOKENDAI, Tokyo 181-8588, Japan National Astronomical Observatory of Japan, Tokyo 181-8588, Japan
T. C. Beers
Affiliation:
Department of Physics, University of Notre Dame, Notre Dame, IN 46556, USA JINA Center for the Evolution of the Elements
Y. S. Lee
Affiliation:
Department of Astronomy and Space Science, Chungnam National University, Daejeon 34134, Korea
S. Honda
Affiliation:
Nishi-Harima Astronomical Observatory, University of Hyogo, Hyogo 679-5313, Japan
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

We report the results of abundance analysis for high-resolution spectra of eight extremely metal-poor turn-off stars selected from SDSS/SEGUE. Based on differential analysis adopting stellar parameters from Balmer line profiles, we obtain the following results: i) Statistically significant scatter is found in [X/Fe] (X=Na, Mg, Cr, Ti, Sr and Ba), among which [Na/Fe] shows an apparent bimodal distribution, ii) Li abundances are ~0.3 dex lower in [Fe/H]<−3.5 than the Spite plateau value without significant scatter.

Type
Contributed Papers
Copyright
Copyright © International Astronomical Union 2018 

References

Aoki, W., Beers, T. C., Lee, Y. S., et al. 2013, AJ, 145, 13Google Scholar
Barklem, P. S., Stempels, H. C., Allende Prieto, C., et al. 2002, A&A, 385, 951Google Scholar
Jeon, M., Besla, G., & Bromm, V. 2017, ArXiv e-prints, arXiv:1702.07355Google Scholar
Kobayashi, C., Umeda, H., Nomoto, K., Tominaga, N., & Ohkubo, T., 2006, ApJ, 653, 1145Google Scholar
Matsuno, T., Aoki, W., Suda, T., & Li, H., 2017a, PASJ, 69, 24Google Scholar
Matsuno, T., Aoki, W., Beers, T. C., Lee, Y. S., & Honda, S., 2017b, AJ, 154, 52Google Scholar
Norris, J. E., Yong, D., Bessell, M. S., et al. 2013, ApJ, 762, 28Google Scholar