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OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS

Published online by Cambridge University Press:  12 February 2018

Man Ho Ling*
Affiliation:
Department of Mathematics and Information Technology, The Education University of Hong Kong, Tai Po, Hong Kong SAR, People's Republic of China E-mail: [email protected]

Abstract

This paper considers simple step-stress accelerated life tests (SSALTs) for one-shot devices. The one-shot device is an item that cannot be used again after the test, for instance, munitions, rockets, and automobile air-bags. Either left-or right-censored data are collected instead of actual lifetimes of the devices under test. An expectation-maximization algorithm is developed here to find the maximum likelihood estimates of the model parameters based on one-shot device testing data collected from simple SSALTs. Furthermore, the asymptotic variance of the mean lifetime under normal operating conditions is determined under the expectation-maximization framework. On the other hand, the optimal design that minimizes the asymptotic variance of the estimate of the mean lifetime under normal operating conditions in terms of three decision variables, including stress levels, inspection times, and sample allocation is discussed. A procedure then is presented to determine the decision variables when a range of stress levels and the termination time of the test as well as normal operating conditions of the devices are given. The properties of the optimal design and the effects of errors in pre-specified planning values of the model parameters are also investigated. Comprehensive simulation studies show that the procedure is quite reliable for the design of simple SSALTs.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2018 

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References

1.Alhadeed, A.A. & Yang, S.S. (2002). Optimal simple step-stress plan for Khamis–Higgins model. IEEE Transactions on Reliability 51: 212215.Google Scholar
2.Alhadeed, A.A. & Yang, S.S. (2005). Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability 54: 6468.Google Scholar
3.Bai, D.S., Kim, M.S. & Lee, S.H. (1989). Optimum simple step-stress accelerated life tests with censoring. IEEE Transactions on Reliability 38: 528532.Google Scholar
4.Balakrishnan, N. & Ling, M.H. (2012). EM Algorithm for one-shot device testing under the exponential distribution. Computational Statistics and Data Analysis 56: 502509.Google Scholar
5.Balakrishnan, N. & Ling, M.H. (2012). Multiple-stress model for one-shot device testing data under exponential distribution. IEEE Transactions on Reliability 61: 809821.Google Scholar
6.Balakrishnan, N. & Ling, M.H. (2013). Expectation maximization algorithm for one shot device accelerated life testing with Weibull lifetimes, and variable parameters over stress. IEEE Transactions on Reliability 62: 537551.Google Scholar
7.Balakrishnan, N. & Ling, M.H. (2014). Gamma lifetimes and one-shot device testing analysis. Reliability Engineering & System Safety 126: 5464.Google Scholar
8.Balakrishnan, N. & Ling, M.H. (2014). Best constant-stress accelerated life-test plans with multiple stress factors for one-shot device testing under a Weibull distribution. IEEE Transactions on Reliability 63: 944952.Google Scholar
9.Balakrishnan, N. & Mitra, D. (2012). Left truncated and right censored Weibull data and likelihood inference with an illustration. Computational Statistics and Data Analysis 56: 40114025.Google Scholar
10.Balakrishnan, N., Ling, M.H. & So, H.Y. (2016). Constant-stress accelerated life-test models and data analysis for one-shot devices. In Fiondella, L. & Puliafito, A. (eds.), Principles of performance and reliability modeling and evaluation, Switzerland: Springer International Publishing, pp. 77108.Google Scholar
11.Balakrishnan, N., So, H.Y. & Ling, M.H. (2015). EM algorithm for one-shot device testing with competing risks under exponential distribution. Reliability Engineering & System Safety 137: 129140.Google Scholar
12.Balakrishnan, N., So, H.Y. & Ling, M.H. (2016). A Bayesian approach for one-shot device testing with exponential lifetimes under competing risks. IEEE Transactions on Reliability 65: 469485.Google Scholar
13.Balakrishnan, N., So, H.Y. & Ling, M.H. (2016). EM algorithm for one-shot device testing with competing risks under Weibull distribution. IEEE Transactions on Reliability 65: 973991.Google Scholar
14.Bhattacharyya, G.K. & Soejoeti, Z. (1989). A tampered failure rate model for step-stress accelerated life test. Communications in Statistics: Theory and Methods 18: 16271643.Google Scholar
15.Chen, D.G. & Lio, Y.L. (2010). Parameter estimations for generalized exponential distribution under progressive type-I interval censoring. Computational Statistics and Data Analysis 54: 15811591.Google Scholar
16.DeGroot, M.H. & Goel, P.K. (1979). Bayesian estimation and optimal designs in partially accelerated life testing. Naval Research Logistics Quarterly 26: 223235.Google Scholar
17.Escobar, L.A. & Meeker, W.Q. (2006). A review of accelerated test models. Statistical Science 21: 552577.Google Scholar
18.Fan, T.H., Balakrishnan, N. & Chang, C.C. (2009). The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing. Journal of Statistical Computation and Simulation 79: 11431154.Google Scholar
19.Gouno, E. (2001). An inference method for temperature step-stress accelerated life testing. Quality and Reliability Engineering International 17: 1118.Google Scholar
20.Gouno, E. (2007). Optimum stepstress for temperature accelerated life testing. Quality and Reliability Engineering International 23: 915924.Google Scholar
21.Kundu, D. & Dey, A.K. (2009). Estimating the parameters of the Marshall–Olkin bivariate Weibull distribution by EM algorithm. Computational Statistics and Data Analysis 53: 956965.Google Scholar
22.Ling, M.H. & Balakrishnan, N. (2017). Model mis-specification analyses of Weibull and gamma models based on one-shot device test data. IEEE Transactions on Reliability 66: 641650.Google Scholar
23.Ling, M.H., Ng, H.K.T., Chan, P.S. & Balakrishnan, N. (2016). Autopsy data analysis for a series system with active redundancy under a load-sharing model. IEEE Transactions on Reliability 65: 957968.Google Scholar
24.Ling, M.H., So, H.Y. & Balakrishnan, N. (2016). Likelihood inference under proportional hazards model for one-shot device testing. IEEE Transactions on Reliability 65: 446458.Google Scholar
25.Louis, T.A. (1982). Finding the observed information matrix when using the EM algorithm. Journal of the Royal Statistical Society, Series B 44: 226233.Google Scholar
26.McLachlan, G.J. & Krishnan, T. (2008). The EM Algorithm and Extensions, 2nd ed. Hoboken, New Jersey: John Wiley & Sons.Google Scholar
27.Miller, R.W. & Nelson, W.B. (1983). Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability 32: 5965.Google Scholar
28.Morris, M.D. (1987). A sequential experimental design for estimating a scale parameter from quantal life testing data. Technometrics 29: 173181.Google Scholar
29.Nandi, S. & Dewan, I. (2010). An EM algorithm for estimating the parameters of bivariate Weibull distribution under random censoring. Computational Statistics and Data Analysis 54: 15591569.Google Scholar
30.Nelson, W.B. (1980). Accelerated life testing—step-stress models and data analysis. IEEE Transactions on Reliability 29: 103108.Google Scholar
31.Nelson, W.B. (1990). Accelerated testing—statistical models, test plans, and data analyses. New York: Wiley.Google Scholar
32.Newby, M. (2008). Monitoring and maintenance of spares and one shot devices. Reliability Engineering & System Safety 93: 588594.Google Scholar
33.Ng, H.K.T., Chan, P.S. & Balakrishnan, N. (2002). Estimation of parameters from progressively censored data using EM algorithm. Computational Statistics and Data Analysis 39: 371386.Google Scholar
34.Scheike, T.H. & Sun, Y.Q. (2007). Maximum likelihood estimation for tied survival data under cox regression model via EM-algorithm. Lifetime Data Analysis 13: 399420.Google Scholar
35.Shaked, M. & Singpurwalla, N.D. (1990). A Bayesian approach for quantile and response probability estimation with applications to reliability. Annals of the Institute of Statistical Mathematics 42: 119.Google Scholar
36.Sohn, S.Y. (1997). Accelerated life-tests for intermittent destructive inspection, with logistic failure-distribution. IEEE Transactions on Reliability 46: 122129.Google Scholar
37.Wang, W.D. & Kececioglu, D.B. (2000). Fitting the Weibull log-linear model to accelerated life-test data. IEEE Transactions on Reliability 49: 217223.Google Scholar
38.Xiong, C., Zhu, K. & Ji, M. (2006). Analysis of a simple step-stress life test with a random stress-change time. IEEE Transactions on Reliability 55: 6774.Google Scholar
39.Zhao, W. & Elsayed, E.A. (2005). A general accelerated life model for step-stress testing. IIE Transactions 37: 10591069.Google Scholar