Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-19T13:32:29.795Z Has data issue: false hasContentIssue false
  • English
  • Français

Powder X-ray diffraction study of synthetic PdSn

Published online by Cambridge University Press:  01 March 2012

František Laufek ,
Anna Vymazalová ,
František Laufek  and
Jakub Plášil
František Laufek
Affiliation:
Czech Geological Survey, Geologická 6, 152 00 Prague 5, Czech Republic
Anna Vymazalová
Affiliation:
Czech Geological Survey, Geologická 6, 152 00 Prague 5, Czech Republic
František Laufek
Affiliation:
Faculty of Science, Charles University, Albertov 6, 128 43 Praha 2, Czech Republic
Jakub Plášil
Affiliation:
Faculty of Science, Charles University, Albertov 6, 128 43 Praha 2, Czech Republic
Get access Rights & Permissions [Opens in a new window]

Abstract

Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (CuKα) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, Pnma) are a=6.1388(4), b=3.89226(3), c=6.3377(4) Å, V=151.43(2) Å3, Z=4, and Dx=9.87 g∕cm3.

Keywords

PdSnpowder diffraction dataRietveld refinement
Type
Technical Articles
Information
Powder Diffraction , Volume 21 , Issue 4 , December 2006 , pp. 307 - 309
Copyright
Copyright © Cambridge University Press 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Coelho, A. A. and Cheary, R. W. (1997). X-ray Line Profile Fitting Program, XFIT, School of Physical Sciences, University of Technology, Sydney, New South Wales, Australia.Google Scholar
ICDD (2002). “Powder Diffraction File,” International Centre for Diffraction Data, edited by McClune, Frank, 12 Campus Boulevard, Newtown Square, PA, 19073–3272.Google Scholar
Knight, J. R. and Rhys, D. W. (1959). “The systems palladium-indium and palladium-tin,” J. Less-Common Met. JCOMAH 1, 292–303.CrossRefGoogle Scholar
Kullerud, G. (1971). “Experimental techniques in dry sulfide research” in Research Techniques for High Pressure and High Temperature, edited by G. C. Ulmer (Springer-Verlag, New York), pp. 288–315.Google Scholar
Nowotny, H., Schubert, K. and Dettinger, U. (1946). “Zur Kenntnis des Aufbaus und der Kristallchemie einiger Edelmetallsysteme (Pd-Pb, Pd-Sn, Ir-Sn, Rh-Sn, Pt-Pb),” Z. Metallkd. ZEMTAE 37, 137–145.Google Scholar
Rodríguez-Carvajal, J. (2006). FullProf.2k Rietveld Profile Matching & Integrated Intensities Refinement of X-ray and/or Neutron Data (powder and/or single-crystal). Laboratoire Léon Brillouin, Centre d’Etudes de Saclay, Gif-sur-Yvette Cedex, France.Google Scholar
Schubert, K., Lukas, H. L., Meissner, H. G., and Bhan, S. (1959). “Zum Aufbau der Systeme Kobalt-Gallium, Palladium-Gallium, Palladium-Zinn und verwandter Legierungen,” Z. Metallkd. ZEMTAE 50, 534–540.Google Scholar
Smith, G. S. and Snyder, R. L. (1979). “F N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing,” J. Appl. Crystallogr. JACGAR 10.1107/S002188987901178X 12, 60–65.CrossRefGoogle Scholar