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Adaptation of the Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis with Secondary Fluorescer X-Ray Machines

Published online by Cambridge University Press:  06 March 2019

R. P. Gardner ,
L. Wielopolski  and
J. M. Doster
R. P. Gardner
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
L. Wielopolski
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
J. M. Doster
Affiliation:
Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27607
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Abstract

The Monte Carlo simulation method that has been previously developed and demonstrated for EDXRF analysis with annular radioisotope excitation sources is extended to systems using secondary fluorescer X-ray machines for excitation. Comparisons of the Monte Carlo predictions with experimental results indicate that the modification is valid.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 129 - 142
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

1. Gardner, R.P. and Hawthorne, A.R., “Monte Carlo Simulation of the X-ray Fluorescence Excited by Discrete Energy Photons in Homogeneous Samples,“ X-ray Spectrometry, 4, 138–148 (1975).Google Scholar
2. Hawthorne, A.R. and Gardner, R.P., “Monte Carlo Models for the Inverse Calculation of Multielement Amounts in XRF Analysis,” Transactions of the American Nuclear Society, Supplement No. 3, 21, 38–39 (1975).Google Scholar
3. Hawthorne, A.R. and Gardner, R.P., “Monte Carlo Simulation of X-ray Fluorescence from Homogeneous Multi-element Samples Excited by Continuous and Discrete Energy. Photons from X-ray Tubes,” Analytical Chemistry, 47, 2220–2225 (1975).Google Scholar
4. Hawthorne, A.R. and Gardner, R.P., “Fundamental Parameters Solution to the X-ray Fluorescence Analysis of Nickel-Iron- Chromium Alloys Including Tertiary Corrections,” Analytical Chemistry, 48, 2130–2135 (1976).Google Scholar
5. Hawthorne, A.R., Gardner, R.P., and Dzubay, T.G., “Monte Carlo Simulation of Self-Absorption Effects in Elemental XRF Analysis of Atmospheric Particulates Collected on Filters,” in Gould, R.W., Barrett, C.S., Newkirk, J.E., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 19, p. 323–337, Kendall Hunt Publishing Company (1976).Google Scholar
6. Hawthorne, A.R. and Gardner, R.P., “Monte Carlo Applications to the X-ray Fluorescence Analysis of Aerosol Samples,” in Dzubay, T.G., Editor, X-Ray Fluorescence Analysis of Environmental Samples, p. 209–220, Ann Arbor Science Publishers (1977).Google Scholar
7. Jaklevic, J.M., Goulding, F.S., Jarrett, B.V., and Meng, J.M., “Application of X-Ray Fluorescence Techniques to Measure Elemental Composition of Particles in the Atmosphere,” in Stevens, E.K. and Herget, W.F., Editors, Analytical Methods Applied to Air Pollution Measurements, p. 123–146, Ann Arbor Science Publishers (1974).Google Scholar
8. Gardner, R.P., Wielopolski, L., and Verghese, K., “Mathematical Techniques for Quantitative Elemental Analysis by Energy Dispersive X-ray Flourescence,” accepted for publication in the International Journal of Radioanalytieal Chemistry.Google Scholar
9. Sherman, J., “The Theoretical Derivation of Fluorescent X-ray Intensities from Mixtures,” Spectrochimica Acta, 7, 283–306 (1955).Google Scholar
10. Sherman, J., “Simplification of a Formula in the Correlation of Fluorescent X-ray Intensities from Mixtures,” Spectrochimica Acta, 15, 466–470 (1959).Google Scholar
11. Dzubay, T.G. and Kelson, R. O., “Self Absorption Corrections for X-ray Fluorescence Analysis of Aerosols,” in Pickles, W.L., Barrett, C.S., Newkirk, J.B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 18, p. 619–631, Plenum Publishing Corporation (1974).Google Scholar