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X-ray powder diffraction of high-absorption materials at the XRD1 beamline off the best conditions: Application to (Gd, Nd)5Si4 compounds

Published online by Cambridge University Press:  28 November 2016

A. M. G. Carvalho Open the ORCID record for A. M. G. Carvalho [Opens in a new window] ,
R. S. Nunes  and
A. A. Coelho
A. M. G. Carvalho*
Affiliation:
Laboratório Nacional de Luz Síncrotron, CNPEM, 13083-970, Campinas, SP, Brazil
R. S. Nunes
Affiliation:
Laboratório Nacional de Luz Síncrotron, CNPEM, 13083-970, Campinas, SP, Brazil Unidade Acadêmica de Física, UFCG, 58429-900, Campina Grande, PB, Brazil
A. A. Coelho
Affiliation:
Instituto de Física Gleb Wataghin, UNICAMP, 13083-859, Campinas, SP, Brazil
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Representative compounds of the new family of magnetic materials Gd5−xNdxSi4 were analyzed by X-ray diffraction at the XRD1 beamline at Laboratório Nacional de Luz Síncrotron. To reduce X-ray absorption, thin layers of the powder samples were mounted outside the capillaries and measured in Debye–Scherrer geometry as usual. The XRD analyses and the magnetometry results indicate that the behavior of the magnetic transition temperature as a function of Nd content may be directly related to the average of the four smallest interatomic distances between different rare earth sites of the majority phase of each compound. The quality and consistency of the results show that the XRD1 beamline is able to perform satisfactory XRD experiments on high-absorption materials even off the best conditions.

Keywords

X-ray powder diffractionsynchrotronrare-earthscompounds
Type
Technical Articles
Information
Powder Diffraction , Volume 32 , Issue 1 , March 2017 , pp. 10 - 14
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Copyright
Copyright © International Centre for Diffraction Data 2016 

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