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X-ray powder diffraction data of CoSi

Published online by Cambridge University Press:  10 January 2013

G. Ghosh ,
G. V. Narasimha Rao ,
V. S. Sastry ,
A. Bharathi ,
Y. Hariharan  and
T. S. Radhakrishnan
G. Ghosh
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
G. V. Narasimha Rao
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
V. S. Sastry
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
A. Bharathi
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
Y. Hariharan
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
T. S. Radhakrishnan
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
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Abstract

X-ray powder diffraction data of CoSi are reported. The sample was prepared by an arc melting process and has a cubic structure (space group P213, space group No. 198) with lattice parameter a=4.4427 Å, Dx=6.591 gcm−3, Z=4, and I/Ic=1.03.

Type
Research Article
Information
Powder Diffraction , Volume 12 , Issue 4 , December 1997 , pp. 252 - 254
Copyright
Copyright © Cambridge University Press 1997

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References

Appleman, D. E., and Evans, H. T., Jr. (1973). “Indexing and Least-Squares Refinement of Powder Diffraction Data,” NTIS Document No. PB-216188, released by NTIS, 5285 Port Royal Road, Springfield, VA 22151.Google Scholar
Eriksson, L., and Westdahl, M. (1985). “TREOR, a Semiexhaustive Trial-and-error Powder Indexing Program for all Symmetries,” J. Appl. Crystallogr. 18, 367–370.Google Scholar
Kakizaki, A., Sugawara, H., Nagakura, I., Ishikawa, Y., Komatsuvara, T., and Ishii, T. (1982). “Extreme Ultra Violet Photo-emission of MnSi, FeSi and CoSi,” J. Phys. Soc. Jpn. 51, 2597.CrossRefGoogle Scholar
Narasimha Rao, G. V., Sastry, V. S., Gopalakrishma Murthy, H. S., Seshagiri, V., and Radhakrishnan, T. S. (1996). “Toward Development of an Ideal X-ray Diffractometer Sample Holder,” Powder Diffr. 11, 200–203.CrossRefGoogle Scholar
Oh, S.-J., Allen, J. W., and Lawrence, J. M. (1987). “Electron Spectroscopy Study of FeSi and CoSi,” Phys. Rev. B 35, 2267–2272.CrossRefGoogle ScholarPubMed
Shinoda, D., and Asanabe, S. (1966). “Magnetic properties of Silicides of Iron Group Transition Elements,” J. Phys. Soc. Jpn. 21, 555.CrossRefGoogle Scholar
Wong-Ng, W., McMurdie, H. F., Paretzkin, B., Zhang, Y., Davis, K. L., Hubbard, C. R., Dragoo, A. L., and Stewart, J. M. (1987). “Reference X-ray Diffraction Powder Patterns of Fifteen Ceramics Phases,” Powder Diffr. 2, 257–265.CrossRefGoogle Scholar