Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-23T18:44:24.728Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray powder diffraction data for In3.85Zr2.80Sn0.35O12

Published online by Cambridge University Press:  05 March 2012

Herman Koster
Herman Koster*
Affiliation:
Laboratory of Inorganic Materials Science, Faculty of Chemical Technology & MESA+ Research Institute, University of Twente, P. O. Box 217, 7500 AE Enschede, The Netherlands
*
a)Electronic mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

X-ray powder diffraction data for In3.85Zr2.80Sn0.35O12 are reported. The powders were prepared using a wet-chemical precipitation method. The XRD data could be fitted with a rhombohedral unit cell in space group R3 (No. 148). The Rietveld refined unit cell parameters are a=0.951 49(2) nm and c=0.889 51(2)nm in a hexagonal setting with Z=3 and Dx=6.69(1)g/cm3.

Type
New Diffraction Data
Information
Powder Diffraction , Volume 18 , Issue 1 , March 2003 , pp. 38 - 41
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Diot, N., Be´nard-Rocherulle´, P., and Marchand, R. (2000). “X-ray powder diffraction data and Rietveld refinement for Ln6WO12 (Ln=Y,Ho),” Powder Diffr. PODIE2 15, 220–226. pdj, PODIE2 CrossRefGoogle Scholar
Gauckler, L. J., and Sasaki, K. (1995). “Ionic and electronic conductivities of homogeneous and heterogeneous materials in the system ZrO2–In2O3,” Solid State Ionics SSIOD3 75, 203–210. ssi, SSIOD3 CrossRefGoogle Scholar
Hohnke, D. K. (1980). “Ionic conductivity of Zr1−xIn2xO2−x,” J. Phys. Chem. Solids JPCSAW 41, 777–784. jpx, JPCSAW CrossRefGoogle Scholar
Nadaud, N., Lequeux, N., and Nanot, M. (1998). “Structural studies of tin-doped indium oxide (ITO) and In4Sn3O12,” J. Solid State Chem. JSSCBI 135, 140–148. jss, JSSCBI CrossRefGoogle Scholar
Powder Diffraction File Database (2000). JCPDS-ICCD, Newtown Square, PA, USA.Google Scholar
Ro¨mer, E. J. W. (2001). “Amperometric NOx-sensor for combustion exhaust gas control,” Thesis, University of Twente, Enschede, Netherlands, ISBN 9036515734.Google Scholar
Smith, G. S., and Snyder, R. L. (1979). “FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing,” J. Appl. Crystallogr. JACGAR 12, 60–65. acr, JACGAR CrossRefGoogle Scholar
Werner, P.-E. et al. (1985). “TREOR: A semi-exhaustive trial and error powder indexing program for all symmetries,” J. Appl. Crystallogr. JACGAR 18, 367–370. acr, JACGAR CrossRefGoogle Scholar
de Wolff, P. M. (1968). “A simplified criterion for the reliability of a powder pattern indexing,” J. Appl. Crystallogr. JACGAR 1, 108–113. acr, JACGAR CrossRefGoogle Scholar