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X-ray powder diffraction analysis of adducts triglycine fluoroberyllic acid and triglycine selenic acid for pyroelectric application

Published online by Cambridge University Press:  05 March 2012

Yunxia Che
Affiliation:
Department of Chemistry Nankai University, 94 Weijin Road Tianjin, 300071, People’s Republic of China
Jimin Zheng
Affiliation:
Department of Chemistry Nankai University, 94 Weijin Road Tianjin, 300071, People’s Republic of China
Jianmin Hao
Affiliation:
Tianjin Electronic Materials Research Institute, Tianjin, 300192, People’s Republic of China
Lianqing Chu
Affiliation:
Tianjin Electronic Materials Research Institute, Tianjin, 300192, People’s Republic of China

Abstract

Two adducts (NH2CH2COOH)3⋅H2BeF4(TGFb) and (NH2CH2COOH)3⋅H2SeO4(TGSe) were obtained and characterized by X-ray powder diffraction. The samples were indexed using the TREOR program [Werner, Z. Kristallogr. Kristallogeom. Kristallphys. Kristallchem. 120, 375–387 (1964)] on a monoclinic unit cell. The lattice parameters of adducts TGFb and TGSe were refined by a least-squares method using the Lattice Constant Refinement Program of the Rikagu software. The refined lattice parameters are a=9.1589(9) Å, b=12.6204(13) Å, c=5.6966(8) Å, β=105.451(9)° for TGFb. The Smith and Snyder figure [Smith and Snyder, J. Appl. Crystallogr. 12, 60–65 (1979)] is F30=39.4(0.0141,54). The refined lattice parameters a=9.5063(11) Å, b=12.8281(10) Å, c=5.8682(7) Å, β=110.353(77)° for TGSe. The Smith and Snyder figure is F30=39(0.0106,73). The powder diffraction results are in agreement with those obtained from single crystal structure data.

Type
New Diffraction Data
Copyright
Copyright © Cambridge University Press 2001

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References

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