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X-Ray Powder Diffraction Analysis of a Photoconductor Material p-Diethylaminobenzaldehyde Diphenylamine Hydrazone

Published online by Cambridge University Press:  10 January 2013

T. C. Huang  and
P. W. Wang
T. C. Huang
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
P. W. Wang
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
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Abstract

A commercially available photoconductor material, p-diethylaminobenzaldehyde diphenylamine hydrazone, C23H25N3, has been purified and recrystallized from an absolute alcohol solution. The triclinic compound has been characterized by X-ray powder diffraction. Experimental 2θ values corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 74 observed reflections with 2θ up to 30.5° are reported. The powder diffraction data have been evaluated, and figures of merit are reported. Unit-cell parameters least-squares refined from the 74 observed reflections of the triclinic compound are in good agreement with those obtained from the single-crystal structure analysis.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 4 , December 1989 , pp. 206 - 208
Copyright
Copyright © Cambridge University Press 1989

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References

Garvey, R.G. (1989). Personal computer version of the program NBS*AIDS83. Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
Huang, T.C. & Parrish, W. (1984). In Adv. X-Ray Anal. 27, 45.Google Scholar
Mighell, A.D., Hubbard, C.R. & Stalick, J.K. (1981). NBS*AIDS80: A FORTRAN Program for crystallographic data evaluation. NBS (U.S.) Tech. Note 1141. Gaithersburg, MD 20899: U.S. Dept. of Commerce, Natl. Bur. Stand.CrossRefGoogle Scholar
Pacansky, J. (1980). IBM Research Report, RJ-2902, IBM Thomas J. Watson Research Center, Distribution Services, P.O. Box 218, Yorktown Heights, NY 10598.Google Scholar
Parrish, W. & Huang, T.C. (1980). In Accuracy in Powder Diffraction, eds. Block, S. & Hubbard, C.R.. NBS Spec. Publ. 567, pp 95–110. Gaithersburg, MD 20899: U.S. Dept. of Commerce, Natl. Bur. Stand.Google Scholar
Smith, D.K. (1968). Norelco Reporter XV, 57;Google Scholar
Borg, I.Y. & Smith, D.K. (1969). Calculated X-Ray Powder Patterns for Silicate Minerals. Boulder, CO: Geological Society of America.CrossRefGoogle Scholar
Smith, G.S. & Snyder, R.L. (1979). FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder pattern indexing. J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Wolff, P.M. de (1968). A simplified criterion for the reliability of a powder pattern indexing. J. Appl. Crystallogr. 1, 108–113.CrossRefGoogle Scholar