Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T01:41:09.855Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Diffraction Profile Analysis of Powdered Samples

Published online by Cambridge University Press:  10 January 2013

G.J. Stanisz ,
J.M. Holender  and
J. Sołtys
G.J. Stanisz
Affiliation:
Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland
J.M. Holender
Affiliation:
Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland
J. Sołtys
Affiliation:
Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland
Get access Rights & Permissions [Opens in a new window]

Abstract

A quantitative phase analysis often requires advanced numerical studies to determine the appropriate intensity values. In this paper the method of fitting analytical functions to the experimental profile is applied to X-ray powder diffraction patterns obtained with FeK radiation. In the present work, the authors examine some problems connected with numerical studies, especially the function describing the experimental profile. The usefulness of the α2 elimination procedure and the angular dependence FWHM are also examined.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 2 , June 1989 , pp. 70 - 73
Copyright
Copyright © Cambridge University Press 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Allegra, G. & Ronca, G. (1978). Acta Crystallogr. A, A14, 1006–1013.CrossRefGoogle Scholar
Cagliotti, G., Pauletti, A. & Ricci, F.P. (1958). Nucl. Instrum., 3, 223–228.CrossRefGoogle Scholar
Delhez, R. & Mittenmeijer, E.J. (1975). J. Appl. Cryst., 8, 609–611.Google Scholar
Howard, S.A. & Snyder, R.L. (1985). “Advances in Materials - Characterization II”, ed. Snyder, R.L.Condrate, R.A. & Johnson, P.F.. New York: Plenum.Google Scholar
Laine, E.S.U., Hiltunen, E.J. & Heinonen, M.H. (1980)., Acta Cryst. A, 28, 1565–1569.Google Scholar
Mignot, P.J. & Rondot, D. (1976). J. Appl. Crystallogr., 9, 460–465.CrossRefGoogle Scholar
Pompa, F. & Zirilli, S. (1982). J. Appl. Crystallogr., 15, 602–604.CrossRefGoogle Scholar
Prince, E. (1983). J. Appl. Crystallogr., 16, 508–511.CrossRefGoogle Scholar
Pyrros, N.P. & Hubbard, C.R. (1983). J. Appl. Crystallogr., 16, 289–294.Google Scholar
Rietveld, H.M. (1981). J. Appl. Crystallogr., 14, 357–361.Google Scholar
Toraya, H. (1986). J. Appl. Crystallogr., 19, 440–447.CrossRefGoogle Scholar
Weiss, Z., Krajićek, J., Smrcok, L. & Fiala, J. (1983). J. Appl. Crystallogr., 16, 493–497.CrossRefGoogle Scholar
Young, R.A. & Wiles, D.B. (1982). J. Appl. Crystallogr., 15, 430–438CrossRefGoogle Scholar
Yûcel, A. (1980) J. Appl. Crystallogr., 13 370–374.Google Scholar