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X-ray diffraction peak-broadening analysis of (La-M)2CuO4 high-Tc superconductors

Published online by Cambridge University Press:  10 January 2013

Davor Balzar ,
Hassel Ledbetter  and
Alexana Roshko
Davor Balzar
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80303, U.S.A.
Hassel Ledbetter
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80303, U.S.A.
Alexana Roshko
Affiliation:
National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80303, U.S.A.
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Abstract

An X-ray diffraction peak-broadening analysis of four oxides is described: La2CuO4 and La1.85M0.15CuO4 (M = Ca,Ba,Sr) high-Tc superconductors. The diffraction line profiles were fitted with a convolution of specimen and instrumental functions, and the specimen peakbroadening angular dependence was analyzed with the Warren-Averbach method. It was found that microstrains and incoherently diffracting domains are highly anisotropic. In the superconductors, stacking-fault probability increases with increasing Tc; microstrain decreases. In La2CuO4, different broadening of (h00) and (0k0) reflections is not caused by stacking faults; it might arise from lower crystallographic symmetry.

Type
Research Article
Information
Powder Diffraction , Volume 8 , Issue 1 , March 1993 , pp. 2 - 6
Copyright
Copyright © Cambridge University Press 1993

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