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The Use of Reference Intensity Ratios in X-Ray Quantitative Analysis

Published online by Cambridge University Press:  10 January 2013

Robert L. Snyder
Robert L. Snyder
Affiliation:
Institute for Ceramic Superconductivity, New York College of Ceramics at Alfred University, Alfred, New York 14802, U.S.A.
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Abstract

Each of the RIR based methods for carrying out quantitative X-ray powder diffraction analysis are described and a consistent set of notation is developed. The so called “standardless” analysis procedures are shown to be a special case of the internal-standard method of analysis where the normalizing assumption is used. All analytical methods, other than the Rietveld whole pattern matching procedure, require the use of explicitly measured standards, typically in the form of RIR values. However, if only semi-quantitative results can be tolerated, the standards may be obtained by using published RIR and relative intensity values. The exciting new techniques of whole pattern fitting and Rietveld constrained quantitative analysis are also described in RIR notation and shown also to be forms of the internal-standard method with the normalization assumption. The quantitative results obtained from Rietveld quantitative analysis are derived from computed standards in the form of computed, normalized, RIRN values. The normalization assumption in Rietveld analysis allows the exclusive use of computed standards and comes as close to a “standardless” analysis as one can achieve: relying on the absence of amorphous material and on the validity of the structural models. Relationships are given for obtaining quantitative analysis from these RIRN values obtainable from the least-squares scale factors.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 4 , December 1992 , pp. 186 - 193
Copyright
Copyright © Cambridge University Press 1992

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