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Ultraviolet emission from high-quality crystalline ultra-long AlN whiskers

Published online by Cambridge University Press:  04 September 2013

Sibin Zuo ,
Haiyun Zhang ,
Jun Wang  and
Wenjun Wang
Sibin Zuo
Affiliation:
Research Center for Applied Finance, School of Banking and Finance, University of International Business and Economics, Beijing 100029, China
Haiyun Zhang
Affiliation:
Research Center for Applied Finance, School of Banking and Finance, University of International Business and Economics, Beijing 100029, China
Jun Wang
Affiliation:
Research and Development Center of Functional Crystal, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
Wenjun Wang*
Affiliation:
Research and Development Center of Functional Crystal, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

We report here the fabrication and characterization of ultra-long AlN whiskers by physical vapor transport method. The obtained whiskers are 1–3 µm in diameter and up to millimeters in length. The whiskers grow along the [0001] crystallographic direction and are well crystallized. They exhibit a strong ultraviolet emission at 345 nm, the shortest wavelength reported in AlN whiskers or nanowires. Our results indicate that these large scales of AlN whiskers are less contaminated by oxygen and other impurities compared with the previously reported ones, which may find wide applications in fabricating ultraviolet optoelectronic devices.

Keywords

AlNwhiskersphysical vapor transportVS mechanism
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 1 , March 2014 , pp. 3 - 7
Copyright
Copyright © International Centre for Diffraction Data 2013 

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