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Total pattern analyses for non-crystalline materials

Published online by Cambridge University Press:  27 May 2020

T. G. Fawcett Open the ORCID record for T. G. Fawcett [Opens in a new window] ,
S. Gates-Rector Open the ORCID record for S. Gates-Rector [Opens in a new window] ,
A. M. Gindhart ,
M. Rost ,
S. N. Kabekkodu ,
J. R. Blanton  and
T. N. Blanton Open the ORCID record for T. N. Blanton [Opens in a new window]
T. G. Fawcett*
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
S. Gates-Rector
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
A. M. Gindhart
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
M. Rost
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
S. N. Kabekkodu
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
J. R. Blanton
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
T. N. Blanton
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania19073, USA
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

A total pattern analysis suite of programs has been developed and incorporated into the ICDD® PDF-4 database. While the suite of programs is intended for the analysis of any diffraction pattern, particular attention was focused on the analysis of common amorphous, non-crystalline, or partially crystalline materials found in minerals, polymers, and pharmaceuticals. The suite of programs directly interfaces to the ICDD database and libraries of non-crystalline references.

Keywords

non-crystalline materialstotal pattern analysispowder diffraction file
Type
Proceedings Paper
Information
Powder Diffraction , Volume 35 , Issue 2 , June 2020 , pp. 82 - 88
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Copyright
Copyright © The Author(s), 2020. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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