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Tables of Experimental Reference Intensity Ratios

Published online by Cambridge University Press:  10 January 2013

Briant L. Davis  and
Deane K. Smith
Briant L. Davis
Affiliation:
Institute of Atmospheric Sciences, South Dakota School of Mines and Technology, Rapid City, South Dakota 57701, U.S.A.
Deane K. Smith
Affiliation:
Department of Geosciences, The Pennsylvania State University, University Park, Pennsylvania 16802, U.S.A.
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Abstract

This paper presents the first Table of RIR values for quantitative analysis as a model for regular updates which will appear in future issues. Diffractionists interested in the reference intensity method of quantitative analysis are urged to read the criteria for preparing data to continue this Table and then to submit new data.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 4 , December 1988 , pp. 205 - 208
Copyright
Copyright © Cambridge University Press 1988

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References

Brindley, G. W., 1945: The effect of grain or particle size on X-ray reflections from mixed powders and alloys, considered in relation to the determination of crystalline substances by X-ray methods. Phil. Mag., 36, 347–369.CrossRefGoogle Scholar
Davis, B. L., 1986: A tubular aerosol suspension chamber for the preparation of powder samples for X-ray diffraction analysis. Powd. Diff. 1, 240–243.CrossRefGoogle Scholar
Davis, B. L., 1988: “Reference Intensity Method of Quantitative X-ray Diffraction Analysis”, 2nd Ed., Grelind Photographies and Typesetters, Rapid City, SD, 213 pp.Google Scholar
Davis, B. L. and Johnson, L. R., 1982: On the use of various filter substrates for quantitative particulate analysis by X-ray diffraction. Atm. Environ., 16, 273–282.CrossRefGoogle Scholar
Davis, B. L. and Johnson, L. R., 1987: The use of mass absorption in quantitative X-ray diffraction analysis. Adv. X-ray Anal., 30, 333–342.Google Scholar
deWolff, P. M. and Visser, J. W., 1964: “Absolute Intensities - Outline of Recommended Practice. Technique for obtaining absolute intensities with internal standard.” Report 641.109, Technisch Physische Dienst TNO EN T. H., Netherlands. Reprinted Pow. Diff. 3, 202–204, 1988.CrossRefGoogle Scholar
Gehringer, R. C., McCarthy, G. J., Garvey, R. G. and Smith, D. K., 1983: X-ray diffraction intensity of oxide solid solutions: Applications to qualitative and quantitative phase analysis. Adv. X-ray Anal., 26, 119–128.Google Scholar
Hubbard, C. R., Evans, E. H. and Smith, D. K., 1976: The reference intensity ratio, I/Ic, for computer simulated powder patterns. J. Appl. Cryst., 9, 169–174.Google Scholar
Hubbard, C. R. and Smith, D. K., 1977: Experimental and calculated standards for quantitative analysis by powder diffraction. Adv. X-ray Anal., 20, 27–39.Google Scholar
James, R. W., 1962: “The optical principles of the diffraction of X-rays”. G. Bell and Sons, Ltd., London, 661 pp.Google Scholar
McCarthy, G. J., Gehringer, R. C., Smith, D. K., Injaian, V. M., Pfoertsch, D. E. and Kabel, R. L., 1981: Internal standards for quantitative X-ray phase analysis: Crystallinity and solid solution. Adv. X-ray Anal., 24, 253–264.Google Scholar
Smith, D. K.Johnson, G. G. Jr., Scheible, A., Wims, A. M., Johnson, J. L. and Ullmann, G., 1987: Quantitative X-ray powder diffraction method using the full diffraction pattern. Powd. Diff., 2, 72–77.Google Scholar