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Synchrotron powder diffraction data for some smectite clay mineral standards

Published online by Cambridge University Press:  24 July 2023

Joel W. Reid Open the ORCID record for Joel W. Reid [Opens in a new window]
Joel W. Reid*
Affiliation:
Canadian Light Source, 44 Innovation Boulevard, Saskatoon, SK S7N 2V3, Canada
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Synchrotron powder diffraction data is presented for a series of relatively phase-pure smectite clay mineral standards obtained from the Clay Minerals Society. Rietveld refinement using a model for turbostratic disorder was performed to estimate the lattice parameters and mineral impurities in the smectite standards. Bragg reflection lists and raw data have been provided for inclusion in the Powder Diffraction File.

Keywords

smectitenontronitemontmorillonitepowder diffractionRietveld refinement
Type
New Diffraction Data
Information
Powder Diffraction , Volume 38 , Issue 3 , September 2023 , pp. 224 - 230
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Copyright
Copyright © The Author(s), 2023. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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References

REFERENCES

Bergmann, J., Friedel, P., and Kleeberg, R.. 1998. “BGMN—A New Fundamental Parameters Based Rietveld Program for Laboratory X-Ray Sources, Its Use in Quantitative Analysis and Structure Investigations.” CPD Newsletter 20 (5): 5–8.Google Scholar
Chipera, S. J., and Bish, D. L.. 2001. “Baseline Studies of the Clay Minerals Society Source Clays: Powder X-Ray Diffraction Analyses.” Clays and Clay Minerals 49 (5): 398–409.CrossRefGoogle Scholar
Döbelin, N. 2019 Personal Communication.Google Scholar
Döbelin, N., and Kleeberg, R.. 2015. “Profex: A Graphical User Interface for the Rietveld Refinement Program BGMN.” Journal of Applied Crystallography 48 (5): 1573–1580.CrossRefGoogle Scholar
Fodje, M., Grochulski, P., Janzen, K., Labiuk, S., Gorin, J., and Berg, R.. 2014. “08B1-1: An Automated Beamline for Macromolecular Crystallography Experiments at the Canadian Light Source.” Journal of Synchrotron Radiation 21 (3): 633–637.CrossRefGoogle ScholarPubMed
Gates-Rector, S., and Blanton, T.. 2019. “The Powder Diffraction File: A Quality Materials Characterization Database.” Powder Diffraction 34 (4): 352–360.CrossRefGoogle Scholar
Gilg, H. A., Kaufhold, S., and Ufer, K.. 2020. “Smectite and Bentonite Terminology, Classification, and Genesis.” Bentonites, Characterization, Geology, Mineralogy, Analysis, Mining, Processing and Uses Geol. Jb. B 107, 1–18.Google Scholar
Harvey, C. C., and Murray, H. H.. 1997. “Industrial Clays in the 21st Century: A Perspective of Exploration, Technology and Utilization.” Applied Clay Science 11 (5-6): 285–310.CrossRefGoogle Scholar
Keeling, J. L., Raven, M. D., and Gates, W. P.. 2000. “Geology and Characterization of Two Hydrothermal Nontronites from Weathered Metamorphic Rocks at the Uley Graphite Mine, South Australia.” Clays and Clay Minerals 48 (5): 537–548.CrossRefGoogle Scholar
Moore, D. M., and Reynolds, R. C. Jr. 1989. X-Ray Diffraction and the Identification and Analysis of Clay Minerals. Oxford University Press (OUP), New York.Google Scholar
Reid, J. W., and Kaduk, J. A.. 2021. “Crystal Structure of Donepezil Hydrochloride Form III, C24H29NO3⋅ HCl.” Powder Diffraction 36 (4): 233–240.CrossRefGoogle Scholar
Reid, J. W., Kaduk, J. A., and Vickers, M.. 2016. “The Crystal Structure of Trandolapril, C24H34N2O5: An Example of the Utility of Raw Data Deposition in the Powder Diffraction File.” Powder Diffraction 31 (3): 205–210.CrossRefGoogle Scholar
Toby, B. H., and Von Dreele, R. B.. 2013. “GSAS-II: The Genesis of a Modern Open-Source All Purpose Crystallography Software Package.” Journal of Applied Crystallography 46 (2): 544–549.CrossRefGoogle Scholar
Tsipursky, S. I., and Drits, V. A.. 1984. “The Distribution of Octahedral Cations in the 2:1 Layers of Dioctahedral Smectites Studied by Oblique-Texture Electron Diffraction.” Clay Minerals 19 (2): 177–193.CrossRefGoogle Scholar
Ufer, K., Roth, G., Kleeberg, R., Stanjek, H., Dohrmann, R., and Bergmann, J.. 2004. “Description of X-Ray Powder Pattern of Turbostratically Disordered Layer Structures with a Rietveld Compatible Approach.” Zeitschrift für Kristallographie-Crystalline Materials 219 (9): 519–527.CrossRefGoogle Scholar
Ufer, K., Stanjek, H., Roth, G., Dohrmann, R., Kleeberg, R., and Kaufhold, S.. 2008. “Quantitative Phase Analysis of Bentonites by the Rietveld Method.” Clays and Clay Minerals 56 (2): 272–282.CrossRefGoogle Scholar
Van Olphen, H., and Fripiat, J. J.. 1979. Data Handbook for Clay Materials and Other Non-Metallic Minerals. Pergamon Press, New York.Google Scholar