Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T23:45:40.619Z Has data issue: false hasContentIssue false

Structure Determination of Tl4V2O7 from Powder Diffraction Data using an Inel X-Ray PSD: Stereochemical Activity of Thallium(I) Lone Pair

Published online by Cambridge University Press:  10 January 2013

A. Jouanneaux
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
O. Joubert
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
M. Evain
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France
M. Ganne
Affiliation:
Institut des Matériaux de Nantes, 2 rue de la Houssinière, 44072 Nantes Cedex 03, France

Abstract

The crystal structure of Tl4V2O7 is solved ab-initio from powder diffraction data collected in Debye-Scherrer geometry using an Inel X-ray Position Sensitive Detector. The structure has been determined from Rietveld analysis in space group ml, Z = 1, with a = 5.9388(2)Å and c = 7.7322(3)Å. The structure of Tl4V2O7 is built up from isolated V2O7 groups aligned along the trigonal c axis. Thallium atoms alternate along a 3-fold axis. The presence of stereochemically active lone pairs is demonstrated and their positions are calculated using a self-consistent electrostatic model. The influence of sample absorption is briefly discussed and the results are compared with those obtained in Bragg-Brentano geometry using flat-plate specimen.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Caglioti, G., Paoletti, A. & Ricci, F.P. (1958). Nucl. Instrum., 3, 223228.CrossRefGoogle Scholar
Deniard, P., Evain, M., Barbet, J.M. & Brec, R. (1991). Materials Science Forum, 79–82, 363370.CrossRefGoogle Scholar
De Wolff, P.M. (1968). J. Appl. Crystallogr. 1, 108113.CrossRefGoogle Scholar
Evain, M., Barbet, J.M., Deniard, P. & Brec, R. (1990). Powder Diffraction Meeting, Toulouse, France.Google Scholar
Evain, M., Deniard, P., Jouanneaux, A. & Brec, R. (1992). In preparation.Google Scholar
Ganne, M. & Tournoux, M. (1971). C.R. Acad. Sc. Paris, 272, 18581860.Google Scholar
Gillespie, R.J. & Nyholm, R.S. (1957). Quart. Rev. Chem. Soc., 11, 339380.CrossRefGoogle Scholar
Hewat, A.W. (1979). Acta Crystallogr. A35, 248.CrossRefGoogle Scholar
Hill, R.J. & Fisher, R.X. (1990). J. Appl. Crystallogr. 23, 462468.CrossRefGoogle Scholar
International Tables for X-ray Crystallography”, (1974). Vol. IV, The Kynoch Press, Birmingham.Google Scholar
Jouanneaux, A., Joubert, O., Fitch, A.N. & Ganne, M. (1991). Mat. Res. Bull., 26, 973982 and references therein.CrossRefGoogle Scholar
Jouini, N. (1986). J. Solid State Chem., 63, 439445.CrossRefGoogle Scholar
Le Bail, A., Duroy, H. & Fourquet, J.L. (1988). Mat. Res. Bull., 23, 447452.CrossRefGoogle Scholar
Murray, A.D. & Fitch, A.N. (1989). MPROF, “A Multipattern Rietveld Refinement Program for Neutron, X-ray and Synchrotron radiation”.Google Scholar
Rietveld, H.M. (1969). J. Appl. Crystallogr. 2, 6571.CrossRefGoogle Scholar
Rouse, K.D. & Cooper, M.J. (1970). Acta Crystallogr. A26, 682691.CrossRefGoogle Scholar
Shanker, J. & Agarwal, S.C. (1976). Indian J. Pure Appl. Phys., 14, 7980.Google Scholar
Sheldrick, G.M. 1986. SHELXS-86, “A Program of Crystal Structure Determination”, Universität Göttingen.Google Scholar
Smith, G.S. & Snyder, R.L. (1979). J. Appl. Crystallogr. 12, 6065.CrossRefGoogle Scholar
Toraya, H. (1986). J. Appl. Crystallogr. 19, 440447.CrossRefGoogle Scholar
Touboul, M., Ganne, M., Cuche, C. & Tournoux, M. (1974). Z. anorg. allg. Chem., 410, 18.Google Scholar
Verbaere, A., Marchand, R. & Tournoux, M. (1978). J. Solid State Chem., 23, 383390.CrossRefGoogle Scholar
Werner, P.E., Eriksson, L. & Westdahl, M.J. (1985). J. Appl. Crystallogr. 18, 367370.CrossRefGoogle Scholar
Yao, T. & Jinno, H. (1982). Acta Crystallogr. A38, 287288.CrossRefGoogle Scholar
Zachariasen, W.H. (1978). J. Less-Common Met., 62, 17.CrossRefGoogle Scholar