Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-25T23:46:22.407Z Has data issue: false hasContentIssue false
  • English
  • Français

Standard X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases

Published online by Cambridge University Press:  10 January 2013

Winnie Wong-Ng ,
Howard F. McMurdie ,
Boris Paretzkin ,
Yuming Zhang ,
Camden R. Hubbard ,
Alan L. Dragoo  and
James M. Stewart
Winnie Wong-Ng
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Howard F. McMurdie
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Boris Paretzkin
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Yuming Zhang
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Camden R. Hubbard
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Alan L. Dragoo
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
James M. Stewart
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Get access Rights & Permissions [Opens in a new window]

Abstract

Fifteen reference patterns of oxides, nitrides, borides, carbides, silicides, and sulfides are included in this report. The general methods of producing these X-ray powder diffraction reference patterns are described in this Journal, Vol. 1, No. 1, pg. 40(1986).

Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent material, glass powder. Samples were prepared by side-drifting the mixture into the holder or by dusting a thin layer on a glass slide coated with a thin smear of silicone grease.

The support and interest of the ICDD in this project is gratefully acknowledged. The expert guidance of R. Roth of the Ceramics Division on material synthesis and the careful review of the manuscript by S. Block of the Ceramics Division and A. D. Mighell of the Reactor Division are fully appreciated. Acknowledgement is also extended to D. Minor for performing sample analysis by using SEM. In the production of these standard powder patterns, the ability to search NBS CRYSTAL DATA has proven invaluable.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 1 , March 1988 , pp. 47 - 56
Copyright
Copyright © Cambridge University Press 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References

1.Kapyshev, A. G., Ivanova, V. V., and Venevtsev, Yu. N. (1966). Sov. Phys. Dokl. 11, 195.Google Scholar
2.Platonov, G.L., Tomashpol'skii, Yu.Ya., Venevtsev, Yu.N., and Zhdanov, G.S., (1967) Izv. Akad. Nauk SSSR, Ser. Fiz. 31, 1108.Google Scholar
1.Kovba, L.M., Lukova, L.N., and Antipov, E.V. (1983) Russ. J. Inorg. Chem. (Engl. Transl.) 28, 409.Google Scholar
2.Kwestroo, W., Van Hal, H.A.M., and Langereis, C. (1974) Mater. Res. Bull. 9, 1631CrossRefGoogle Scholar
1.Brandt, I.G. (1944). Ark. Kemi, Mineral. Geol. 17A, 8.Google Scholar
2.Young, A.P., Schwartz, C.M. (1962). Acta Crystallogr. 15, 1305.CrossRefGoogle Scholar
1.Kapyshev, A.G., Ivanova, V.V., and Venevtsev, Yu.N. (1966). Doklady Akad. Nauk SSSR 167, 564.Google Scholar
1.Wild, S., Grieveson, P., Jack, K.H. (1972) Spec. Ceram., 5, 385.Google Scholar
2.Ruddlesden, S.N. and Popper, P. (1958) Acta Crystallogr., 11, 465CrossRefGoogle Scholar
1.Smith, J.F. and Bailey, D.M., (1957) Acta Crystallogr., 10, 341CrossRefGoogle Scholar
2.Cotter, P.J., Kohn, J.A. and Potter, R.A., (1956) J. Ceram. Soc., 39, 11CrossRefGoogle Scholar
1.Robertson, B., and Kostiner, E. (1972) J. Solid State Chem. 4, 29.CrossRefGoogle Scholar
2.Muller, J., and Joubert, J.-C. (1975) J. Solid State Chem. 14, 8.CrossRefGoogle Scholar
1.Datta, R.K., (1971) J. Am. Ceram. Soc., 54, 262CrossRefGoogle Scholar
2.Foster, L. M. and Stumpf, H. C. (1951) J. Am. Chem. Soc. 73, 5324.Google Scholar
3.Joubert, J-C., Brunei, M., Waintal, H., and Durif., A. (1963) C. R. Hebd. Seances Acad. Sci., 256, 5234Google Scholar
1.Range, K.J., and Leeb, R. (1975). Z. Naturforsch., Anorg. Chem., Org. Chem. 30B 637.Google Scholar
2.Calvert, L. Priv. Commun.Google Scholar
1.Jones, M., and Marsh, R. (1954). J. Am. Chem. Soc. 76, 1434.CrossRefGoogle Scholar
1.Van Gool, E.W.,(editor)(1973). “Fast Ion Transport in Solids/Solid State Batteries and Devices”, p. 217North Holland Publishing Co. Amsterdam.Google Scholar
2.Ekstrom, T. (1971). Acta Chem. Scand. 25, 2591.CrossRefGoogle Scholar
1.Rudy, E., Benesovsky, F., and Toth, L. (1963). Z. Metallkd. 54, 345.Google Scholar
1.Jellinek, F., Brauer, G., and Muller, H. (1960). Nature, 185, 376.CrossRefGoogle Scholar
1.Pringle, G.E. (1972) Acta Crystallogr., B28, 2326.CrossRefGoogle Scholar
2.Evers, J., Delinger, G., and Weiss, , (1977) A. J. Solid State Chem. 20 173.CrossRefGoogle Scholar
1.Kiessling, R. (1947) Acta Chem. Scand. 1, 893.CrossRefGoogle Scholar
2.Kuzma, Yu. B., Serebryakova, T.I., and Plakhing, A.M. (1967). Russ. J. Inorg. Chem. 12, 288.Google Scholar
3.Spears, K., and Blanks, (Priv. Com)Google Scholar