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A Simplified Correction for Surface Roughness Effects in X-Ray Diffractometric Investigations

Published online by Cambridge University Press:  10 January 2013

R. Vasudevan ,
R. Ramesh ,
B. Pathiraj  and
B.H. Kolster
R. Vasudevan
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology, Madras 600 036, India
R. Ramesh
Affiliation:
Foundation for Advanced Metals Science (SGM) 7550 KA HENGELO, The Netherlands
B. Pathiraj
Affiliation:
Foundation for Advanced Metals Science (SGM) 7550 KA HENGELO, The Netherlands
B.H. Kolster
Affiliation:
Foundation for Advanced Metals Science (SGM) and Materials Science Section, Faculty of Mechanical Engineering, University of Twente, Enschede, The Netherlands
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Abstract

The importance of surface roughness to the measurement of integrated intensity in X-ray powder diffraction is discussed following studies conducted with materials in both powder and bulk (rolled sheet/billet) forms possessing different absorption characteristics. A simple procedure is described which allows for surface roughness effect.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 2 , June 1992 , pp. 77 - 82
Copyright
Copyright © Cambridge University Press 1992

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References

Barrett, C.S.& Massalski, T.B.(1966). Structure of Metals and Alloys, McGraw Hill, New York.Google Scholar
DeWolff, P.M.& Sas, W.H.(1969). Acta Crystallogr.A 25, 206–209.CrossRefGoogle Scholar
Harrison, R.J.& Paskin, A.(1964). Acta Crystallogr. 17, 325–331.CrossRefGoogle Scholar
Hubbard, C.R., Evans, E.H.& Smith, D.K.(1976). J. Appl. Crystallogr. 9, 169–174.CrossRefGoogle Scholar
Inkinnen, O.(1969). Acta Crystallogr.A 25, 214–222.CrossRefGoogle Scholar
International Tables for X-ray Crystallography(1962). Vol. III, Kynoch Press, Birmingham.Google Scholar
Jennings, L.D.(1969). Acta Crystallogr.A 25, 217–222.CrossRefGoogle Scholar
McKeehan, M.& Warren, B.E.(1953). J. Appl. Phys. 24(1), 52–56.CrossRefGoogle Scholar
Otto, J.(1984). Z. Kristallogr. 167, 55–64.CrossRefGoogle Scholar
Roberts, B.W.(1954). Acta Met. 2, 597–331.CrossRefGoogle Scholar
Suortti, P.(1972). J. Appl. Crystallogr. 5, 325–331.CrossRefGoogle Scholar
Suortti, P.(1977). Acta. Crystallogr. 33, 1012–1027CrossRefGoogle Scholar