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S48 X-ray Diffraction at Constant Penetration Depth — A Viable Approach for Characterizing Steep Residual Stress Gradients

Published online by Cambridge University Press:  20 May 2016

T. Erbacher ,
A. Wanner ,
O. Vöhringer  and
T. Beck
T. Erbacher
Affiliation:
E.ON Kernkraft, Hannover, Germany
A. Wanner
Affiliation:
Universitaet Karlsruhe, Karlsruhe, Germany
O. Vöhringer
Affiliation:
Universitaet Karlsruhe, Karlsruhe, Germany
T. Beck
Affiliation:
Forschungszentrum Jülich, Jülich, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 187
Copyright
Copyright © Cambridge University Press 2008

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