Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T14:20:39.806Z Has data issue: false hasContentIssue false

Rietveld Structure Refinement of Metastable Lithium Disilicate Using Synchrotron X-Ray Powder Diffraction Data From the Daresbury SRS 8.3 Diffractometer

Published online by Cambridge University Press:  10 January 2013

R.I. Smith
Affiliation:
Department of Chemistry, University of Aberdeen, Meston Walk, Old Aberdeen, AB9 2UE, Scotland, U.K.
A.R. West
Affiliation:
Department of Chemistry, University of Aberdeen, Meston Walk, Old Aberdeen, AB9 2UE, Scotland, U.K.
I. Abrahams
Affiliation:
Department of Chemistry, Heriot-Watt University, Riccarton, Edinburgh, EH 14 4AS, Scotland, U.K.
P.G. Bruce
Affiliation:
Department of Chemistry, Heriot-Watt University, Riccarton, Edinburgh, EH 14 4AS, Scotland, U.K.

Abstract

The crystal structure of metastable Li2Si2O5, Fw = 150.05, has been refined by the Rietveld method using high resolution X-ray powder diffraction data recorded at the Daresbury Synchrotron Radiation Source on the new 8.3 diffractometer. Li2Si2O5, in keeping with many compounds of interest to the materials scientist, exhibits relatively broad diffraction peaks. It is important to establish the quality of crystal structure data that may be obtained from such materials on this new instrument. Various functions were used to model the peak shape from this instrument; a split-Pearson VII function appeared to be marginally superior to Pearson VII or Pseudo-Voigt functions. Refinement was carried out using the split-Pearson VII in the space group Pbcn (60) and terminated with a = 5.6871(6), b = 4.7846(5), c = 14.645(1) Å, V = 398.50 Å3, Z=4, Dc= 2.502 gcm−3, Rwp = 17.06, Rex = 14.48 and Χ2 = 1.39. The refined parameters are compared with those obtained from a previous single crystal X-ray determination.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cernick, R., Pattison, P., Murray, P., Catlow, C.R.A. & Fitch, A. (1988). SERC Bulletin 3(12), 1415.Google Scholar
Fischer, R.X. (1985). J. Appl Crystallogr. 18(4), 258262.CrossRefGoogle Scholar
Fitch, A.N. & Murray, A.D. (1989). Private communication.Google Scholar
Fitch, A.N., Murray, A.D., Pattison, P. & R., CernickJ. Appl. Crystallogr. (in press).Google Scholar
International Tables for Crystallography (1983). Vol.A. Dordrecht, Holland/Boston, USA: Reidel.Google Scholar
International Tables for X-Ray Crystallography (1974). Vol.IV. Birmingham, England: Kynoch.Google Scholar
Lightfoot, P., Cheetham, A.K. & Sleight, A.W. (1988). In Chemical Crystallography with Pulsed Neutrons and Synchrotron X-Rays, ed. Carrondo, M.A. and Jeffrey, G.A.. Dordrecht/Boston/Lancaster/Tokyo: Reidel.Google Scholar
Murray, A.D. (1988). PODSUM. University College London.Google Scholar
Murray, A.D. & Fitch, A.N. (1989). Powder Diffraction Program Library (PDPL). University College London and University of Keele.Google Scholar
Parrish, W., Hart, M. & Huang, T.C. (1986). J. Appl. Crystallogr. 19, 92100.CrossRefGoogle Scholar
Rietveld, H.M. (1969). J. Appl. Crystallogr. 2, 6571.CrossRefGoogle Scholar
Smith, R.I., Aragón-Piña, A.Villafuerte-Castrejón, M.E., Howie, R.A. & West, A.R. (1989). Acta Crystallogr. Sect. C., 46, 363365.CrossRefGoogle Scholar
Toraya, H. (1986). J. Appl. Crystallogr. 19, 440447.CrossRefGoogle Scholar