Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-23T19:37:36.276Z Has data issue: false hasContentIssue false

Rietveld refinement of the gadolinium strontium oxide SrGd2O4

Published online by Cambridge University Press:  05 March 2012

H. Chaker
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, 3018 Sfax, Tunisia
A. Kabadou
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, 3018 Sfax, Tunisia
M. Toumi
Affiliation:
Laboratoire de Chimie Inorganique et Structurale, Faculté des Sciences de Bizerte, Bizerte, Tunisia
R. Ben Hassen*
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, 3018 Sfax, Tunisia
*
a)Author to whom correspondence should be addressed; electronic mail: [email protected]

Abstract

Powder X-ray diffraction (XRD) data were collected for a new phase of SrGd2O4. Analysis using the Rietveld method was carried out and it was found that the sample crystallizes in the orthorhombic symmetry with CaFe2O4 related structure. The lattice parameters are found to be a=12.0521(2) Å, b=10.1327(2) Å, c=3.4757(4) Å and Z=4. For X-ray data RF=4.9%, RB=7.6%, RP=8.1% and χ2=1.51. The structure can be described as an assembly of bioctahedron [Gd2O10] which are linked together by O2− anions and of dodecahedron of SrO8.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Acharya, B., Muralidhar, J., and Pradhan, L. (1991). Regional Lab., Orissa, India, ICDD Grant-in-Aid, ICCD Index No. 42-0343.Google Scholar
Barry, R. (1967). J. Inorg. Nucl. Chemi. 29, ICCD Index No. 19-0889.Google Scholar
Bednorz, J. G., and Müller, K. A. (1986). Z. Phys. B: Condens. Matter ZPCMDN 64, 189. zpb, ZPCMDN CrossRefGoogle Scholar
Coelho, A. A., and Cheary, R. W. (1997). XFIT program, Fundamental Parameters Approach to X-ray Line Profile Analysis, Version 4.4.Google Scholar
Iwahara, H., Uchida, H., Kondo, K., and Ogaki, K. (1988). J. Electrochem. Soc. JESOAN 135, 529. jes, JESOAN CrossRefGoogle Scholar
Le Bail, A., Duroy, H., and Fourquet, J. L. (1988). Mater. Res. Bull. MRBUAC 23, 447. mrb, MRBUAC Google Scholar
Minh, N. Q. (1993). J. Am. Ceram. Soc. JACTAW 76, 563. jac, JACTAW Google Scholar
Mueller-Bushbaum, H. K., and Schenck, R. V. (1970). “Untersuchungen an SrYb2O4, CaYb2O4 und CaLu2O4: Ein Beitrag zur Kristallstruktur des Calciumferrat (III) Typs;Z. Anorg. Allg. Chem. ZAACAB 377, 7078. zaa, ZAACAB Google Scholar
Pfoertsch, D. (1980). Ruud, C., Penn State University, University Park, Pennsylvania, USA, ICDD Grant-in-Aid, ICCD Index No. 32-1254, 1272.Google Scholar
Rao, C. N. (1993). J. Mater. Sci. Eng. B ZZZZZZ 18, 1.Google Scholar
Rietveld, H. M. (1969). “A profile refinement methodfor nuclear and magnetic structures,” J. Appl. Crystallogr. JACGAR 2, 6571. acr, JACGAR Google Scholar
Rodriguez-Carjaval, J. (1990). “XVth Congress of the International Union of Crystallography,” Proceedings of the Satellite Meeting on Powder Diffraction, Toulouse, p. 127.Google Scholar
Roisnel, T. (2001). WinPLOTR program, Laboratoire de Chimie du Solide et Inorganique Moléculaire, UMR 6511 CNRS-Université de Rennes 1, Institut de Chimie de Rennes, Avenue du Général Leclerc, 35042 Rennes cedex, France.Google Scholar
Saiki, A., Ishizawa, N., Mizutani, N., and Kato, M. (1984). “Structural change of C-type rare earth oxides, Ytterbium oxide and Erbium oxide at high temperatures,” Acta Crystallogr., Sect. B: Struct. Sci. ASBSDK 40, 7682. acl, ASBSDK Google Scholar
Schreiner, W. (1994). IC Laboratories, Katonah, NY, USA, ICDD Grant-in-Aid, ICCD Index No. 46-0132,0133,0148.Google Scholar
Shanon, R. D. (1976). “Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides,” Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr. ACACBN A32, 751767. aca, ACACBN CrossRefGoogle Scholar
Sheldrick., G. M. (1997). Shelxl program, University of Gottingen, Germany.Google Scholar
Shirley, R. (2000). CRYSFIRE program, An Interactive Powder Indexing Support Program, Version 9.34g (QBasic), University of Surrey Guildford, Surrey GU2 7XH, England.Google Scholar
Sreedharan, O. M., Lawrence, F., and Mathews, T. (2000). Proceedings of the First Asian Conference on Solid State Ionic Devices, Science and Technologie (FACSSIDST 2000), p. 130.Google Scholar
Young, R. A., and Wiles, D. B. (1982). “Profile shape functions in Rietveld refinements,” J. Appl. Crystallogr. JACGAR 15, 430438. acr, JACGAR Google Scholar