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Quantification of crystalline fraction of solid slag film using X-ray powder diffraction

Published online by Cambridge University Press:  17 February 2016

Changlin Yang*
Affiliation:
College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, China
Guanghua Wen
Affiliation:
College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, China
Ping Tang
Affiliation:
College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, China
Chaochao Xi
Affiliation:
College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, China
Qihao Sun
Affiliation:
College of Materials Science and Engineering, Chongqing University, Chongqing, 400044, China
*
a)Author to whom correspondence should be addressed. Electronic mail:[email protected]

Abstract

This paper introduces a new method to determine the crystalline fraction in samples containing amorphous phases from experimental X-ray diffraction data. Computer generated codes, one for each measured data point, are used to interpret the pattern as to where diffraction peaks exist and what is the angular breadth of each peak's intensity above background. Two parameters are defined that are used to identify the position and intensity of the crystalline phase diffraction peaks. For mold fluxes used in continuous casting, the crystalline fraction of solid slag film is a key factor that can affect heat transfer between solidified shell and mold. In this work, a new method was developed to determine the crystallinity of solid slag films. This method does not require structure parameters or other references, and results can be obtained directly by reading a text file with diffraction data. Results indicate that, there is a positive correlation between crystalline fraction and integrated intensities corresponding to crystalline phases. The selection of integration interval does not have much effect on results. To simplify computations, 20–45°2θ was considered as an appropriate interval.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2016 

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References

Bish, D. L. and Post, J. E. (1993). “Quantitative mineralogical analysis using the Rietveld full-pattern fitting method,” Am. Mineral. 78, 932940.Google Scholar
Cho, J. W. and Shibata, H. (2001). “Effect of solidification of mold fluxes on the heat transfer in casting mold,” J. Non-Crystal. Solids 282, 110117.CrossRefGoogle Scholar
Cho, J. W., Shibata, H., Emi, T., and Suzuki, M. (1998). “Thermal resistance at the interface between mold flux film and mold for continuous casting of steels,” ISIJ Int. 38, 440446.CrossRefGoogle Scholar
Fawcett, T. G., Crowder, C. E., Kabekkodu, S. N., Needham, F., Kaduk, J. A., Blanton, T. N., Petkov, V., Bucher, E., and Shpanchenko, R. (2013). “Reference materials for the study of polymorphism and crystallinity in cellulosics,” Powder Diffr. 28, 1831.Google Scholar
Gravier, S., Donnadieu, P., Lay, S., Doisneau, B., Bley, F., Salvo, L., and Blandin, J. J. (2010). “Evaluation of the crystal volume fraction in a partially nanocrystallized bulk metallic glass,” J. Alloys Compd. 504S, S226S229.Google Scholar
Katsumasa, Y., Yoshitake, T., and Akira, N. (1998). “Crystallinity of analysis of glass-ceramics by the rietveld method,” J. Am. Ceram. Soc. 81, 29782982.Google Scholar
Le Blond, J., Cressey, G., Horwell, C. J., and Williamson, B. J. (2009). “A rapid method for quantifying single mineral phase in heterogeneous natural dusts using X-ray diffraction,” Powder Diffr. 24, 1723.Google Scholar
Luisa, B., Federica, B., Isabella, L., Cristina, L., and Monia, M. (2005). “The anorthite-diopside system: structure and devitrification study. Part II. Crystallinity analysis by the Rietveld–RIR method,” J. Am. Ceram. Soc. 88, 31313136.Google Scholar
Martin, J., Beauparlant, M., Lesage, J., and Tra, H. V. (2012). “Development of a quantification method for quartz in various bulk materials by X-ray diffraction and the Rietveld method,” Powder Diffr. 27, 1219.Google Scholar
Mills, K. C., Courtney, L., Fox, A. B., Harris, B., Idoyaga, Z., and Richardson, M. J. (2002). “The use of thermal analysis in the determination of the crystalline fraction of solid slag films,” Thermochim. Acta 391, 175184.Google Scholar
Mills, K. C., Fox, A. B., Li, Z., and Thackray, R. P. (2005). “Performance and properties of mould fluxes,” Ironmaking Steelmaking 32, 2634.CrossRefGoogle Scholar
Ming, H., Mengqiang, W., Shuren, Z., Xiaohua, Z., Ting, Z., and Song, C. (2010). “Quantitative analysis of crystalline and remaining glass phases in CaO–B2O3–SiO2 ternary system glass ceramics,” J. Alloys Compd. 506, 757760.Google Scholar
Sarsfield, B. A., Davidovich, M., Desikan, S., Fakes, M., Futernik, J. L., Hilden, J. S., Tan, S., Yin, G., Young, G., Vakkalagadda, B., and Volk, K. (2005). “Powder X-ray diffraction detection of crystalline phases in amorphous pharmaceuticals,” 205, 322327.Google Scholar
Taylor, J. C. and Rui, Z. (1992). “Simultaneous use of observed and calculated standard profiles in quantitative XRD analysis of minerals by the multiphase Rietveld method: the determination of pseudorutile in mineral sands products,” Powder Diffr. 7, 152161.Google Scholar
Wen, G. H., Tang, T., Yang, B., and Zhu, X. B. (2012). “Simulation and characterization on heat transfer through mould slag film,” ISIJ Int. 52, 11791185.CrossRefGoogle Scholar
Yang, H. W., Wen, J., Quan, M. X., and Wang, J. Q. (2009). “Evaluation of the volume fraction of nanocrystals devitrified in Al-based amorphous alloys,” J. Non-Crystal. Solids 35S, 235238.Google Scholar
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