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PULWIN: A program for analyzing powder X-ray diffraction patterns

Published online by Cambridge University Press:  10 January 2013

Sergio Brückner
Sergio Brückner*
Affiliation:
Dipartimento di Scienze e Tecnologìe Chimiche, via Cotonificio 108, I-33100 Udine, Italy
*
a)Electronic mail: [email protected]
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Abstract

A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/.

Type
Technical Articles
Information
Powder Diffraction , Volume 15 , Issue 4 , December 2000 , pp. 218 - 219
Copyright
Copyright © Cambridge University Press 2000

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References

Brückner, S. (2000).J. Appl. Crystallogr. 33, 977–979.CrossRefGoogle Scholar
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Press, W. H., Teukolsky, S. A., Vetterling, W. T., and Flannery, B. P. (1999). Numerical Recipes in C (Cambridge University Press, Cambridge), pp. 650–651.Google Scholar