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Preparation and characterization of La1.8Sr0.2CuO4/La1.9Sr0.1CuO4 superconducting bilayers

Published online by Cambridge University Press:  07 October 2013

Y. Zhang ,
Y.H. An ,
Y. Xing ,
D.Y. Dong ,
S.L. Wang ,
J.Q. Shen ,
P.G. Li  and
W.H. Tang
Y. Zhang
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
Y.H. An
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
Y. Xing
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
D.Y. Dong
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
S.L. Wang
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
J.Q. Shen
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
P.G. Li*
Affiliation:
Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou 310018, China
W.H. Tang
Affiliation:
State Key Laboratory of Information Photonics and Optical Communication, School of Science, Beijing University of Posts and Telecommunications, Beijing 100876, China
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

The c-oriented La1.8Sr0.2CuO4 and La1.9Sr0.1CuO4 bilayer films were deposited on (001) SrTiO3 single-crystal substrates by using the pulsed laser deposition technique. The effects of deposition parameters on the quality of thin films were investigated. The crystal structures and surface morphologies were characterized by means of XRD and SEM, and the results showed that an as-prepared film deposited with the optimized parameters has high quality. Then La1.8Sr0.2CuO4/La1.9Sr0.1CuO4 bilayers structure was prepared using the optimized parameters for each corresponding layer, and the electrical transport properties were measured. Interesting rectifying properties were observed at both room and low temperatures, and the rectifying ratio at low temperature was found to be much higher than that at room temperature.

Keywords

La2−xSrxCuO4 thin filmpulsed laser depositionsuperconducting bilayersrectifying property
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Supplement S1 , September 2013 , pp. S7 - S11
Copyright
Copyright © International Centre for Diffraction Data 2013 

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