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Powder diffraction data of BaFCl

Published online by Cambridge University Press:  10 January 2013

R. Kesavamoorthy
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
G. V. Narasimha Rao
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
B. Sundarakkannan
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
G. Ghosh
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
V. Sankara Sastry
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India

Abstract

X-ray powder diffraction data of BaFCl are reported for 2θ from 5° to 150° at 25 °C. Strain-free and dendrite-free single crystals of BaFCl, grown by flux method with KCl as flux, were powdered for recording this data. BaFCl is tetragonal, space group P4/nmm, with a=4.3964(1) Å and c=7.2315(3) Å.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1997

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References

Appleman, D. E., and Evans, H. T. Jr. (1973). U.S. Geological Survey, Computer Contribution 20, U.S. National Technical Information Service, Document PB2-16188.Google Scholar
De Siebenthal, J. M., Bill, H., and Lacroix, R. (1974). “Paramagnetic resonance results in a tetragonal Eu 2+ center in SrFCl crystals,” Solid State Commun. 14, 167168.CrossRefGoogle Scholar
Narasimha Rao, G. V., Sastry, V. S., Gopala Krishna Murthy, H. S., Seshagiri, V., and Radhakrishnan, T. S. (1996). “Toward development of an ideal X-ray diffractometer sample holder,” Powder Diffr. 11, 200203.CrossRefGoogle Scholar
Nicklaus, E., and Fisher, F. (1972). “A modified Kyropoulos method for growing BaFCl single crystals,” J. Cryst. Growth 12, 337338.CrossRefGoogle Scholar
Sauvage, M. (1974). “Refinement of the structures of SrFCl and BaFCl,” Acta Crystallogr., Sect. B. 30, 27862787.CrossRefGoogle Scholar
Shen, Y. R., and Holzapfel, W. B. (1995). “Effect of pressure on energy levels of Sm 2+ in BaFCl and SrFCl,” Phys. Rev. B 51,15 752–15 761.CrossRefGoogle ScholarPubMed
Smith, K. L., and Smith, D. K. (1991), Micro-POWD, V. 2.31, Material Data Inc., Livermore, CAGoogle Scholar
Somaiah, K., and Hari Babu, V. (1976). “Etch pits and dislocations in BaFCl, BaFBr, SrFCl and SrFBr crystals,” Indian J. Pure Appl. Phys. 14, 702704.Google Scholar
Takahashi, K., Miyahara, J., and Shibahara, Y. (1985). “Photostimulated luminescence (PSL) and color centers in BaFX:Eu 2+ (X=Cl, Br, I) phosphors,” J. Electrochem. Soc. 132, 14921494.CrossRefGoogle Scholar
Young, R. A., Sakthivel, A., Moss, T. S., and Paiva Santos, C. O. (1995). “DBWS-9411 an upgrade of DBWS *. * Programs for Rietveld refinement with PC and mainframe computers,” J. Appl. Crystallogr. 28, 366367.CrossRefGoogle Scholar