Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T23:36:36.347Z Has data issue: false hasContentIssue false
  • English
  • Français

Notes on Slits and Monochromators in Accurate Powder Diffractometry

Published online by Cambridge University Press:  10 January 2013

J. Timmers ,
N.M. van der Pers ,
G.J.M. Sprong ,
Th.H. de Keijser  and
R. Delhez
J. Timmers
Affiliation:
Faculty of Applied Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands
N.M. van der Pers
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
G.J.M. Sprong
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
Th.H. de Keijser
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
R. Delhez
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
Get access Rights & Permissions [Opens in a new window]

Abstract

Limitations in powder diffractometry imposed by scatter slits and/or a diffracted-beam monochromator, which have been ignored in the past, are discussed and mapped quantitatively. These limitations become manifest especially with ωoffsets, i.e.in stress measurements and with ωoscillation to improve the reproducibility of intensities in the presence of too coarse grains. The limitations can only be established with knowledge of slit sizes and with precise alignment of all slits, their holders and the diffracted-beam monochromator. To that end, concise, accurate procedures for obtaining these measurements in-situare proposed.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 2 , June 1992 , pp. 83 - 88
Copyright
Copyright © Cambridge University Press 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Birks, L.S.(1963). Electron Probe Microanalysis, 47–53. New York: John Wiley and Sons.Google Scholar
Klug, H.P.& Alexander, L.E.(1974). X-ray diffraction procedures for polycrystalline and amorphous materials, secondedition, Sections 5-1.4 and 5-2.1. New York: John Wiley and Sons.Google Scholar
Parrish, W.(1967). The Review of Scientific Instruments 41, 1779–1782.CrossRefGoogle Scholar
Proctor, E.M., Furnas, T.C.& Loranger, W.F.(1971). Advances in X-ray Analysis, Vol. 14, edited by Barret, C.S., Newkirk, J.B.& Ruud, C.O., pp. 38–56. New York: Plenum Press.Google Scholar
Timmers, J., N.M. van der, Pers, Sprong, G.J.M., Keijser, Th.H. de& Delhez, R.(1992). In preparation.Google Scholar