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New Copper (II) — Rare Earth (III) Compounds1 I. Ternary Systems CuO-M2O3-TO2

Published online by Cambridge University Press:  10 January 2013

U. Lambert
Affiliation:
Mineralogisch-Petrographisches Institut, Universität Heidelberg, FRG.
W. Eysel
Affiliation:
Mineralogisch-Petrographisches Institut, Universität Heidelberg, FRG.

Abstract

Ternary systems CuO-M2O3-TO2 with T = Si, Ge and M3+ = Al, Ga, Fe, Cr, Bi and Y were investigated at 1000°C. Ternary compounds were found only for M3+ = Y. CuY2Ge2O8 is monoclinic with a = 9.477 Å, b = 15.005 Å, c = 8.030 Å and β = 147.50°; CuY2 Si4 O12 is monoclinic with a = 7.052 Å, b = 14.283 Å, c = 4.738 Å and β = 103.32°; CuY2Ge4O12 is triclinic with a = 7.185 Å, b = 7.949 Å, c = 4.910 Å, α = 86.83°, β = 102.70° and γ = 113.84°. The last two structures are closely related. The binary double oxide series Cu2Ln2O5 was reinvestigated.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1986

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References

Bergerhoff, G. and Kasper, H.: Die Kristallstruktur des Kupfer-Indium-Oxyds, Cu2In2O5. Acta Cryst. 24, 388391 (1968).CrossRefGoogle Scholar
Breuer, K.-H.: LSQRL, least squares program for lattice parameter refinement, Basic, 1979 (unpublished).Google Scholar
Breuer, K.-H.: CORGUIN, a program for the correction of Guinier patterns with internal standard, Basic, 1980 (unpublished).Google Scholar
Breuer, K.-H. and Eysel, W.; The calorimetric calibration of Differential Scanning Calorimetry Cells. Thermochimica Acta 57, 317329 (1982).CrossRefGoogle Scholar
Cinarz, M.-B.: Phasenbeziehungen in den Systemen CuO-R2O3-GeO2 (R = Ga, Bi, Sb) und Kupferoxid - MgO - GeO2. Diploma Thesis Universität Heidelberg, 1984.Google Scholar
Evans, H. T., Appleman, D. E., and Handwerker, D. S.: LSUCRE, program for least squares unit cell refinement. Meeting of the Amer. Cryst. Assoc., Mass. 1963.Google Scholar
Freund, H.-R. and Müller-Buschbaum, Hk.: Über Oxocuprate XXIII. Zur Kenntnis von Ho2Cu2O5. Z. Naturforsch. 32b, 609611 (1977a).CrossRefGoogle Scholar
Freund, H.-R. und Müller-Buschbaum, Hk.: Über Oxocuprate XXIII. Zur Kenntnis von Lu2Cu2O5 and Sc2Cu2O5. Z. Naturforsch. 32b, 11231124 (1977b).CrossRefGoogle Scholar
Freund, H.-R. und Müller-Buschbaum, Hk.: Über Oxocuprate XXV. Zur Kenntnis von In2Cu2O5. Z. Anorg. Allgem. Chem. 441, 103106 (1978).CrossRefGoogle Scholar
Greis, O., Stede, P. and Andress, H.: EGUIN, program for length correction of powder diffraction patterns with internal standards, (1980) (unpublished).Google Scholar
Heinrich-Beda, A.: Beiträge zur Kristallchemie des Cu(II) in Silikaten. Ph.D. Thesis, ETH Zürich, Nr. 7303 (1983).Google Scholar
Keller, B.: Phasenbeziehungen in den Systemen CuO-R2O3-SiO2 (R = Ga, Bi, Sb) und Kupferoxid - MgO - SiO2. Diploma Thesis, Universität Heidelberg, 1984.Google Scholar
Kimizuka, N., Takayama, E., Horiuchi, S., Yamamoto, A. and Fujita, T.: Ln2Cu2O5 compounds (Ln = Lu, Yb, Tm, Ho, Er, Dy, Tb, Y). J. Sol. State Chem. 42, 322324 (1982).CrossRefGoogle Scholar
Lambert, U.: Kristallchemische Untersuchungen in den Systemen CuO-R2O3 bzw. RE2O3-SiO2 und CuO-R2O3 bzw. RE2O3-GeO2. Diploma Thesis, Universitat Heidelberg, 1982.Google Scholar
Lambert, U. and Eysel, W.: New silicates and germanates in systems CuO-R2O3-TO2. Fortschr.Miner. 61, Beiheft 1, 125 (1983).Google Scholar
Lambert, U. and Eysel, W.: New copper(II) — Rare Earth (III) compounds. II. Crystal chemistry of CuLn2Ge2O8, CuLn2Si4O14 and CuLn2Ge4O12. Powder Diffraction 1, 1986 (in press).Google Scholar
Santander, N.H. and Kubaschewski, O.: The thermodynamics of the copper-oxygen system. High Temperatures-High Pressures 7, 573582 (1975).Google Scholar
Schmitz-DuMont, O. und Kasper, H.: Farbe und Konstitution bei anorganischen Feststoffen, Monatsh. Chem. 96, 506515 (1965).Google Scholar
Standard Reference Material (SRM) 640. Silicon Powder X-ray Diffraction Standard, now replaced by silicon SRM640a. Nat'l. Bur. Stand. (U.S.), Office of Standard Reference Materials, Gaithersburg, MD 20899.Google Scholar
Visser, J. W.: A fully automatic program for finding the unit cell from powder data. J. Appl. Cryst. 2, 8995 (1969).CrossRefGoogle Scholar