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A method of material design for systematic absence of X-ray diffraction

Published online by Cambridge University Press:  06 March 2012

Huan-hua Wang*
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
*
a)Electronic mail: [email protected]

Abstract

Materials with systematic absence of X-ray diffraction (XRD) peaks are desirable for conducting some special researches using X-ray diffraction or time-resolved X-ray scattering. This paper proposes a method for designing this kind of materials. It utilizes solid solution to reduce the structure factor of a selected reflection to zero by choosing proper components and their contents to let the reflection amplitudes from different atomic layers in a unit cell of the solid solution cancel each other completely. This method on how to select a solid solvent and how to calculate its content was illustrated using SrTiO3 as an example. A solid solution Sr1−xCaxTiO3 with a systematic absence of the (001) diffraction can be designed, and the value of x can be determined to be x=0.54 using an iteration calculation process. This result was verified by the experimental XRD pattern of a Sr0.46Ca0.54TiO3 sample.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2010

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References

Als-Nielsen, J. and McMorrow, D. (2001). Elements of Modern X-Ray Physics (Wiley, New York).Google Scholar
Brixner, L. H. (1960). “X-ray study and electrical properties of the systems SrMoxZr1−xO3 and SrMoxTi1−xO3,” J. Inorg. Nucl. Chem.JINCAO 15, 356358.10.1016/0022-1902(60)80065-6CrossRefGoogle Scholar
Durst, G., Grotenhuis, M., and Barkow, A. G. (1950). “Solid solubility study of barium, strontium, and calcium titanates,” J. Am. Ceram. Soc.JACTAW 33, 133139.10.1111/j.1151-2916.1950.tb12775.xCrossRefGoogle Scholar
Ferguson, J. D., Woll, A. R., Arikan, G., Dale, D. S., Amassian, A., Tate, M. W., and Brock, J. D. (2008), “Time resolved in-situ diffuse x-ray scattering measurements of the surface morphology of homoepitaxial SrTiO3 films during pulsed laser deposition,” Mater. Res. Soc. Symp. Proc.MRSPDH 1034, 1034-K10–20.Google Scholar
Fleet, A., Dale, D., Suzuki, Y., and Brock, J. D. (2005). “Observed effects of a changing step-edge density on thin-film growth dynamics,” Phys. Rev. Lett.PRLTAO 94, 036102.10.1103/PhysRevLett.94.036102CrossRefGoogle ScholarPubMed
Prince, E.(2004). “Tables 6.1.1.4 coefficients for analytical approximation to the scattering factors of Tables 6.1.1.1 and 6.1.1.3,” in International Tables of Crystallography, Vol. C (Third Edition), p. 578.Google Scholar
Tabata, H., Ueda, K., and Kawai, T. (1998). “Construction of ferroelectric and/or ferromagnetic superlattices by laser MBE and their physical properties,” Mater. Sci. Eng., BMSBTEK 56, 140146.10.1016/S0921-5107(98)00232-3CrossRefGoogle Scholar
Tischler, J. Z., Eres, G., Larson, B. C., Rouleau, C. M., Zschack, P., and Lowndes, D. H. (2006). “Nonequilibrium interlayer transport in pulsed laser deposition,” Phys. Rev. Lett.PRLTAO 96, 226104-1226104-4.10.1103/PhysRevLett.96.226104CrossRefGoogle ScholarPubMed
Warren, B. E. (1990). X-ray Diffraction (Dover, New York).Google Scholar