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Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Published online by Cambridge University Press:  15 October 2014

Ying Liu ,
Susumu Imashuku  and
Jun Kawai
Ying Liu*
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
Susumu Imashuku
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
Jun Kawai
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm−2.

Keywords

low-power TXRFhigh-power XRD tubepower supplydiffractometer guide rail
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Issue 1 , March 2015 , pp. 36 - 39
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Copyright
Copyright © International Centre for Diffraction Data 2014 

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References

Egorov, V. K. and Egorov, E. V. (2004). “The experimental background and the model description for the waveguide-resonance propagation for X-ray radiation through a planar narrow extended slit,” Spectrochim. Acta B 59, 1049–1069.CrossRefGoogle Scholar
Greaves, E. D., Meitín, J., Sajo-Bohus, L., Castelli, C., Liendo, J., and Borger, M. D. C. (1995). “Trace element determination in amniotic fluid by total reflection X-ray fluorescence,” Adv. X-Ray Chem. Anal. Jpn. 26s, 47–52.Google Scholar
Klockenkämper, R. (1997). Total Reflection X-ray Fluorescence Analysis (Wiley, New York).Google Scholar
Kortright, J. B. and Thompson, A. C. (2009). “X-Ray Emission Energies,” in X-ray Data Booklet, edited by Thompson, A. C. (Lawrence Berkeley National Laboratory, Berkeley), 3rd ed., pp. 1–19 and 1–20.Google Scholar
Kunimura, S. and Kawai, J. (2007). “Portable total reflection X-ray fluorescence spectrometer for nanogram Cr detection limit,” Anal. Chem. 79, 2593–2595.Google Scholar
Kunimura, S. and Kawai, J. (2010a). “Portable total reflection X-ray fluorescence spectrometer for ultra trace elemental determination,” Adv. X-Ray Chem. Anal., Jpn. 41, 29–44.Google Scholar
Kunimura, S. and Kawai, J. (2010b). “Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation,” Analyst 135, 1909–1911.CrossRefGoogle ScholarPubMed
Liu, Y., Imashuku, S., and Kawai, J. (2013). “Multi-element analysis by portable total reflection X-ray fluorescence spectrometer,” Anal. Sci. 29, 793–797.CrossRefGoogle ScholarPubMed
Sakurai, K., Eba, H., Inoue, K., and Yagi, N. (2002). “Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10−16 g-level trace metals,” Anal. Chem. 74, 4532–4535.Google Scholar
Streli, C., Pepponi, G., Wobrauschek, P., Jokubonis, C., Falkenberg, G., Záray, G., Broekaert, J., Fittschen, U., and Peschel, B. (2006). “Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L,” Spectrochim. Acta B 61, 1129–1134.Google Scholar
Streli, C., Wobrauschek, P., Meirer, F., and Pepponi, G. (2008). “Synchrotron radiation induced TXRF,” J. Anal. At. Spectrom. 23, 792–798.CrossRefGoogle Scholar
Wobrauschek, P. (2007). “Total reflection X-ray fluorescence analysis – a review,” X-ray Spectrom. 36, 289–300.Google Scholar
Wobrauschek, P. and Kregsamer, P. (1989). “Total reflection X-ray fluorescence analysis with polarized X-rays, a compact attachment unit, and high energy X-rays,” Spectrochim. Acta 44B, 453–460.Google Scholar
Wobrauschek, P., Görgl, R., Kregsamer, P., Streli, C., Pahlke, S., Fabry, L., Haller, M., Knöchel, A., and Radtke, M. (1997). “Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis,” Spectrochim. Acta B 52, 901–906.Google Scholar
Wobrauschek, P., Streli, C., Kregsamer, P., Meirer, F., Jokubonis, C., Markowicz, A., Wegrzynek, D., and Chinea-Cano, E. (2008). “Total reflection X-ray fluorescence attachment module modified for analysis in vaccum,” Spectrochim. Acta B 63, 1404–1407.CrossRefGoogle Scholar