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Lattice deformation measurements via “on site X-ray diffraction”

Published online by Cambridge University Press:  14 November 2013

G. Berti ,
F. de Marco  and
M. E. del Seppia
G. Berti*
Affiliation:
University of Pisa, R&D XRD Lab., Earth Science Dep.
F. de Marco
Affiliation:
XRD-Tools S.r.l.
M. E. del Seppia
Affiliation:
XRD-Tools S.r.l.
*
E-mail: [email protected]
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Abstract

The present paper is about the estimation of lattice deformation from data collected from manufactures directly on site. The aim here is to give evidence that the concept of the Mean Equivalent Lattice (MEL), when applied to “on site X-Ray Diffraction” is the basis for a reliable qualification of the material rheology to external solicitations. Such method allows for the identification of lattice deformations without resorting to the computation of the residual stress with using the elasticity constants (i.e. tensile, shear and rigidity constants E, μ, ν); these elasticity constants descend from the classical theory of solid mechanics, where the continuum mechanics and the material isotropic model are the fundaments. Any MEL deformation is instead related to the variation of the d-spacing among lattice planes which are connected to the anisotropic atomic arrangement. So the macroscopic scale is constituted by a number of MELs and related boundaries. The recent on site X-ray diffraction technology may offer effective and easy solutions, with a significant impact on reliability of results, simplification, economy and time consuming.

Keywords

Lattice deformation measurementselastic and plastic deformationsx-ray diffractionresidual stressmean equivalent latticequality control process
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Supplement S2 , September 2013 , pp. S209 - S219
Copyright
Copyright © International Centre for Diffraction Data 2013 

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