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JCPDS — International Centre for Diffraction Data Sample Preparation Methods in X-Ray Powder Diffraction

Published online by Cambridge University Press:  10 January 2013

R. Jenkins ,
T. G. Fawcett ,
D. K. Smith ,
J. W. Visser ,
M. C. Morris  and
L. K. Frevel
R. Jenkins
Affiliation:
JCPDS Data Collection and Analysis Subcommittee
T. G. Fawcett
Affiliation:
The Dow Chemical Co.
D. K. Smith
Affiliation:
The Pennsylvania State University
J. W. Visser
Affiliation:
Technisch Physische Dienst, Delft, The Netherlands
M. C. Morris
Affiliation:
National Bureau of Standards
L. K. Frevel
Affiliation:
The Dow Chemical Co. (Ret.) andJohns Hopkins University
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Extract

The aim of any diffraction experiment is to obtain reproducible data of high accuracy and precision so that the data can be correctly interpreted and analyzed. Various methods of sample preparation have been devised so that reproducibility, precision and accuracy can be obtained. The success of a diffraction experiment will often depend on the correct choice of preparation method for the sample being analyzed and for the instrument being used in the analysis.

A diffraction pattern contains three types of useful information: the positions of the diffraction maxima, the peak intensities, and the intensity distribution as a function of diffraction angle. This information can be used to identify and quantify the contents of the sample, as well as to calculate the material's crystallite size and distribution, crystallinity, and stress and strain. The ideal preparation for a given experiment depends largely on information desired.

Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 2 , June 1986 , pp. 51 - 63
Copyright
Copyright © Cambridge University Press 1986

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