Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-23T19:29:50.997Z Has data issue: false hasContentIssue false

Introduction to two-dimensional X-ray diffraction

Published online by Cambridge University Press:  06 March 2012

Bob Baoping He*
Affiliation:
Bruker Advanced X-ray Solutions, Inc., 5465 East Cheryl Parkway, Madison, Wisconsin 53711
*
a)Electronic mail: [email protected]

Abstract

Two-dimensional X-ray diffraction refers to X-ray diffraction applications with two-dimensional detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take advantage of two-dimensional diffraction, new theories and approaches are necessary to configure the two-dimensional X-ray diffraction system and to analyze the two-dimensional diffraction data. This paper is an introduction to some fundamentals about two-dimensional X-ray diffraction, such as geometry convention, diffraction data interpretation, and advantages of two-dimensional X-ray diffraction in various applications, including phase identification, stress, and texture measurement.

Type
Two-Dimensional Detectors
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Borgonovi, G. M. (1984). Determination of Residual Stress from Two-Dimensional Diffraction Pattern, Nondestructive Methods for Material Property Determination (Plenum, New York), p. 47.Google Scholar
Bunge, H. J., and Klein, H. (1996). “Determination of quantitative, high-resolution pole figures with the Aea detector,” Z. Metallkd. ZEMTAE 87, 465475. zem, ZEMTAE Google Scholar
He, B. B., Preckwinkel, U., and Smith, K. L. (1998). “Advantages of using 2D detectors for residual stress measurements,” Advances in X-ray Analysis Vol. 42, the 47th Annual Denver X-ray Conference, Colorado Springs, CO.Google Scholar
He, B. B., Preckwinkel, U., and Smith, K. L. (1999). “Fundamentals of two-dimensional X-ray diffraction (XRD2),” Advances in X-ray Analysis Vol. 43, the 48th Annual Denver X-ray Conference, Steamboat Springs, CO.Google Scholar
He, B. B., and Smith, K. L. (1998). “Fundamental equation of strain and stress measurement using 2D detectors,” Proceedings of 1998 SEM Spring Conference on Experimental and Applied Mechanics, Houston, TX.Google Scholar
Jenkins, R., and Snyder, R. L. (1996). Introduction to X-ray Powder Diffractometry (Wiley, New York).CrossRefGoogle Scholar
Rudolf, P. R., and Landes, B. G. (1994). “Two-dimensional X-ray diffraction and scattering of microcrystalline and polymeric materials,” Spectroscopy ZZZZZZ 9, 2233.Google Scholar
Sasaki, T. et al. (1996). “Influence of image processing conditions of Debye Scherrer ring images in X-ray stress measurement using imaging plate,” Adv. X-ray Anal. AXRAAA40, the 45th Annual Denver X-ray Conference, Denver, CO.Google Scholar
Smith, K. L., and Ortega, R. B. (1993). “Use of a two-dimensional, position sensitive detector for collecting pole figures,” Adv. X-ray Anal. AXRAAA 36, 641647. axr, AXRAAA Google Scholar
Sulyanov, S. N., Popov, A. N., and Kheiker, D. M. (1994). “Using a two-dimensional detector for X-ray powder diffractometry,” J. Appl. Crystallogr. JACGAR 27, 934942. acr, JACGAR CrossRefGoogle Scholar
Yoshioka, Y., and Ohya, S. (1994). “X-ray analysis of stress in a localized area by use of image plate,” Proceedings of ICRS-4, Baltimore, MD.Google Scholar