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In-situ monitoring of vanadium dioxide formation using high-temperature XRD

Published online by Cambridge University Press:  07 May 2014

Mark A. Rodriguez ,
Nelson S. Bell ,
James J. M. Griego ,
Cynthia V. Edney  and
Paul G. Clem
Mark A. Rodriguez*
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Nelson S. Bell
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
James J. M. Griego
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Cynthia V. Edney
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Paul G. Clem
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

The monoclinic-to-tetragonal phase transition (~70 °C) in vanadium dioxide (VO2) strongly impacts the infrared properties, which enables its use in applications such as smart window devices. Synthesis of VO2 can be challenging due to the variability of vanadium oxide phases that may be formed. We have employed high-temperature X-ray diffraction (HTXRD) to monitor the reaction process of vanadium oxide precursor powders to form the desired tetragonal VO2 phase. Single-phase tetragonal VO2 was formed within 30 min at 420 °C in flowing N2 gas (~50 ppm O2). The monoclinic-to-tetragonal phase transformation was observed via HTXRD at ~70 °C with the typical ~10 °C hysteresis (i.e. approached from above or below the transition).

Keywords

vanadium dioxidehigh-temperature XRD
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 2 , June 2014 , pp. 97 - 101
Copyright
Copyright © International Centre for Diffraction Data 2014 

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