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Indexing of the Powder Diffraction Pattern of Yttrium Oxalate Dihydrate

Published online by Cambridge University Press:  10 January 2013

D. Louër ,
F. Deneuve  and
F. Ecochard
D. Louër
Affiliation:
Laboratoire de Cristallochimie (URA 254), Université de Rennes I, Avenue du Général Leclerc, 35042 Rennes cedex, France.
F. Deneuve
Affiliation:
Rhône Poulenc Recherches, 52 rue de la Haie Coq, 93308 Aubervilliers cedex, France.
F. Ecochard
Affiliation:
Rhône Poulenc Recherches, 52 rue de la Haie Coq, 93308 Aubervilliers cedex, France.
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Abstract

Yttrium oxalate dihydrate, Y2(C2O4)3.2H2O, has been investigated by means of X-ray powder diffraction. Unit cell dimensions were determined by an indexing program based on the variation of parameters by successive dichotomies. The diffractometer data were collected with strictly monochromatic radiation. A monoclinic cell was found: a=9.3811(8)Å, b=11.6385(15)Å, c=5.9726(7)Å, β=96.079(8)°, which is characterized by the figures of merit M20=87 and F30=112 (0.0065,41). A preliminary analysis of the anisotropic line broadening has revealed some microstructural properties. It is shown that line broadening is mainly due to a micro-strain effect.

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 2 , June 1990 , pp. 104 - 105
Copyright
Copyright © Cambridge University Press 1990

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References

Fuller, M.J.& Pinkstone, J.(1980) J. Less Comm. Metals, 70, 127–142.CrossRefGoogle Scholar
Langford, J.I., Louër, D., Sonneveld, E.J.& Visser, J.W.(1986) Pow. Diff., 7, 211–221.CrossRefGoogle Scholar
Louër, D.& Langford, J.I.(1988) J. Appl. Cryst., 21, 430–437.Google Scholar
Louër, D.& Louër, M.(1972) J. Appl. Cryst., 5, 271–275.CrossRefGoogle Scholar
Louër, D.& Vargas, R.(1982) J. Appl. Cryst., 15, 542–545.CrossRefGoogle Scholar
Mighell, A.D., Hubbard, C.R.& Stalik, J.K., NBS*AIDS80: A FORTRAN Program for Crystallographic Data Evaluation. Nat. Bur. Stand. (U.S.) Tech. Note 1141 (1981). (NBS*AIDS83 is an expanded version of NBS*AIDS80).Google Scholar
Wagner, C.N.J.& Aqua, E.N.(1964) Advances in X-ray Analysis, 7, 46–55.Google Scholar