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High-energy synchrotron X-ray diffraction measurements of simple bending of pseudoelastic NiTi shape memory alloy wires

Published online by Cambridge University Press:  23 May 2016

Baozhuo Zhang  and
Marcus L. Young
Baozhuo Zhang*
Affiliation:
Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76207
Marcus L. Young
Affiliation:
Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76207
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Many technological applications of austenitic shape memory alloys (SMAs) involve cyclical mechanical loading and unloading in order to take advantage of pseudoelasticity. In this paper, we investigated the effect of mechanical bending of pseudoelastic NiTi SMA wires using high-energy synchrotron radiation X-ray diffraction (SR-XRD). Differential scanning calorimetry was performed to identify the phase transformation temperatures. Scanning electron microscopy images show that micro-cracks in compressive regions of the wire propagate with increasing bend angle, while tensile regions tend not to exhibit crack propagation. SR-XRD patterns were analyzed to study the phase transformation and investigate micromechanical properties. By observing the various diffraction peaks such as the austenite (200) and the martensite ( ${\bar 1}12$ ), ( ${\bar 1}03$ ), ( ${\bar 1}11$ ), and (101) planes, intensities and residual strain values exhibit strong anisotropy, depending upon whether the sample is in compression or tension during bending.

Keywords

synchrotron radiation X-ray diffraction (SR-XRD)NiTi shape memory alloy wirebending
Type
Technical Articles
Information
Powder Diffraction , Volume 31 , Issue 2 , June 2016 , pp. 104 - 109
Copyright
Copyright © International Centre for Diffraction Data 2016 

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