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A Geometric Factor for Asymmetric Diffraction

Published online by Cambridge University Press:  10 January 2013

Danut Dragoi
Affiliation:
ICPMS Sos. Garii Catelu Str., 5, sector 3, Bucharest, Romania

Abstract

In many experiments on X-ray stress analysis, the tilt angle Ψ shows that for a given peak the integrated intensity function of Ψ is not a constant. In this paper a geometric factor is described which corrects the integrated intensity in asymmetric X-ray diffraction. The defocussing effect, always present in asymmetric X-ray diffraction, reduces the number of diffracted X-ray photons registered by the detector. For a θ/2θ diffractometer, the new correction was found to be dependent on the divergence angle of source and detector slit, the tilt angle Ψ and the Bragg angle θ.

The experimental results corrected with the proposed factor are in good agreement with the theory in limits of acceptable errors.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1992

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References

Klug, H.P. & Alexander, L.E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, John Wiley & Sons, 2nd ed.Google Scholar