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F-60 Invited—XAFS Studies of Nanosystems: How X-ray, Electron Microscopy, and Optical Techniques Each Contribute to Structural Characterization

Published online by Cambridge University Press:  20 May 2016

B. A. Bunker
B. A. Bunker
Affiliation:
University of Notre Dame, Notre Dame, IN
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 173
Copyright
Copyright © Cambridge University Press 2008

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