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F-23 Invited—Applications of XRF in CRM Development at the National Institute of Standards and Technology

Published online by Cambridge University Press:  20 May 2016

J. R. Sieber
J. R. Sieber
Affiliation:
NIST, Gaithersburg, MD
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 213
Copyright
Copyright © Cambridge University Press 2010

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