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Evaluating experimental methods and techniques in X-ray diffraction using 280 000 data sets in the Powder Diffraction File

Published online by Cambridge University Press:  06 March 2012

T. G. Fawcett ,
S. N. Kabbekodu ,
J. Faber ,
F. Needham  and
F. McClune
T. G. Fawcett*
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
S. N. Kabbekodu
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
J. Faber
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
F. Needham
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
F. McClune
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
*
a)Electronic mail: [email protected]
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Abstract

Release 2003 of the Powder Diffraction File (PDF) contains ∼280 000 unique entries organized in a series of tables in a relational database format. The PDF is available in two products, PDF-4/Full File and PDF-4/Organics, which allow users to access and query over 150 million filled entry fields. An editorial database is used to generate the commercial products that contain tables of experimental details and statistical evaluation criteria used by the editors to evaluate quality and determine quality marks for each entry in the PDF. This editorial database has nearly doubled the searchable entry fields. This database was mined to evaluate experimental methods in X-ray diffraction. Both experimental powder diffraction data and data calculated from predominantly single crystal X-ray structural analyses were assigned statistical quality criteria. For experimental powder data, the average delta two theta values for all d-spacings in the entry set were used. Calculated data were evaluated using R factor values as the primary quality criteria. A Quality Index, which measures the errors in refined unit cell parameters divided by the magnitude of the cell parameter, can be used to compare all types of data. Experimental variables were then analyzed versus these criteria. Variables include optic configuration, (i.e., Seeman–Bohlin, Guinier, Debye–Scherrer), use of internal and external standards, use of monochromators, wavelength divergence, wavelength selection, equipment radius, specimen transparency, and specimen absorption. This study significantly differs from prior round robin analyses in that the use of the database allows us to study very large population sets for every variable analyzed.

Type
Technical Articles
Information
Powder Diffraction , Volume 19 , Issue 1 , March 2004 , pp. 20 - 25
Copyright
Copyright © Cambridge University Press 2004

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References

Cullity, D. B. (1967). Elements of X-ray Diffraction (Addison–Wesley, Reading, MA).Google Scholar
Faber, J.and Fawcett, T. (2002). “The Powder Diffraction File: present and future,” Acta Crystallogr., Sect. B: Struct. Sci. ASBSDK B58, 325–332. acl, ASBSDK CrossRefGoogle Scholar
Faber, J.and Needham, F. (2002). “The New Organic Powder Diffraction File: Applications for Polymorph and Search-Indexing,” American Pharmacuetical Rev.70–74.Google Scholar
International Centre for Diffraction Data, “Public Report 2002,” pp. 4–5. The report is also available at www.icdd.comGoogle Scholar
Jenkins, R. and Snyder, R. L. (1996). X-ray Powder Diffractometry (Wiley, New York).Google Scholar
Kabekkodu, S. N., Faber, J., and Fawcett, T. (2002). “New Powder Diffraction File (PDF-4) in relational database format: advantages and data-mining capabilities,” Acta Crystallogr., Sect. B: Struct. Sci. ASBSDK B58, 333–337.CrossRefGoogle Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Diffraction Procedures (Wiley, New York).Google Scholar
Maschiocchi, N. and Artioli, G. (1997). “Lattice Parameter Determination from Powder Diffraction Data: Results from a Round Robin Project,” Methods and Practices (ICDD, Newtown Square, PA).Google Scholar
Silicon, PDF 00-27-1402, National Bureau of Standards, Monograph 25, 13, 35 (1976). The data correspond to Standard Reference Material (SRM) 640.Google Scholar
Standard Reference Materials for X-ray diffraction available from the National Institute of Standards and Technology (NIST) Standard Reference Materials, National Institute of Standards and Technology, 100 Bureau Drive, Stop 2322 Gaithersburg, MD 20899-2322.Google Scholar
Wong-Ng, W. and Hubbard, C. R. (1997). “Standard References for X-ray Diffraction. II. Calibration Using D-Spacing Standards,” Methods and Practices (ICDD, Newtown Square, PA).Google Scholar