Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-23T18:44:42.025Z Has data issue: false hasContentIssue false

Effect of layer structure boundary on the hectorite basal diffraction

Published online by Cambridge University Press:  01 March 2012

Il Mo Kang*
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Myung Hun Kim
Affiliation:
Department of Chemistry, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Youn Joong Kim
Affiliation:
Division of Nano-Material and Environmental Science, Korea Basic Science Institute, Taejon, 305-333, Korea
Hi-Soo Moon
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Yungoo Song
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
*
a)Electronic mail: [email protected]

Abstract

This study examined basal peak irrationalities according to boundary conditions of the hectorite basal diffraction unit (BDU), which were recognized as the total assembly of 2:1 phyllosilicate layer plus interlayer material. The hectorite basal profiles were computer-simulated using the three kinds of BDU settings identified from the middle of octahedral sheets in the nearest neighbor (centrosymmetric model), the middle of interlayers in the nearest neighbor (centrosymmetric model), and a basal oxygen plane to the margin of interlayer in contact with the next phyllosilicate layer (non-centrosymmetric model). In the results of simulations, irrationality and asymmetry of the hectorite basal peaks relied straightforwardly on the BDU scattering modulations for the non-Bragg angles containing information on the synergic scattering events of phyllosilicate layer and interlayer material. Among the concerned BDU boundaries, the non-centrosymmetric model more effectively represented the real hectorite profile than the two previously reported centrosymmetric models.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Ames, L. L., Sand, L. B. Jr., and Goldrich, S. S. (1958). “A contribution on the Hector, California bentonite deposit,” Geochim. Cosmochim. Acta GCACAK 47, 363375.Google Scholar
Bailey, S. W. (1980). “Summary of recommendations of A1PEA nomenclature committee,” Clays Clay Miner. CLCMAB 28, 7378.Google Scholar
Ferrage, E., Lanson, B., Malikova, N., Plançon, A., Sakharov, B. A., and Drits, V. A. (2005). “New insights on the distribution of interlayer water in bi-hydrated smectite from X-ray diffraction profile modeling of 00l reflections,” Chem. Mater. CMATEX 17, 34993512.CrossRefGoogle Scholar
Kang, I. M., Kim, M. H., Kim, Y. J., Moon, H. S., and Song, Y. (2005). “Evaluation of expandability for randomly interstratified illite/smectite using interstratificational peak broadening,” Powder Diffr. PODIE2 10.1154/1.1894086 20, 230232.CrossRefGoogle Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York), 2nd ed., 966 pp.Google Scholar
Lagaly, G. (1994). “Layer charge determination by alkylammonium ions,” in Layer Charge Characteristics of 2:1 Silicate Clay Minerals, edited by Mermut, A. R. (The Clay Minerals Society, Boulder), pp. 246.Google Scholar
Moll, W. F. (2001). “Baseline studies of the Clay Minerals Society source clays: Geological origin,” Clays Clay Miner. CLCMAB 49, 374380.CrossRefGoogle Scholar
Moore, D. M. and Reynolds, R. C. (1997). X-ray Diffraction and the Identification and Analysis of Clay Minerals (Oxford University Press, Oxford), 2nd ed., 378 pp.Google Scholar
Mystkowski, K., Środorń, J., and Elsass, F. (2000). “Mean thickness and thickness distribution of smectite crystallites,” Clay Miner. CLMIAF 10.1180/000985500547016 35, 545557.CrossRefGoogle Scholar
Reynolds, R. C. (1965). “An X-ray study of an ethylene glycol-montmorillonite complex,” Am. Mineral. AMMIAY 50, 9901001.Google Scholar
Reynolds, R. C. (1980). “Interstratified clay minerals,” in Crystal Structures of Clay Minerals and their X-ray Identification, edited by Brindley, G. W. and Brown, G. (Mineralogical Society, London), pp. 249303.CrossRefGoogle Scholar
Reynolds, R. C. (1985). “NEWMOD©, a computer program for the calculation of one-dimensional X-ray diffraction patterns of mixed-layered clay minerals,” published by the author, New Hampshire.Google Scholar
Reynolds, R. C. (1989). “Diffraction by small and disordered crystals,” in Modern Powder Diffraction, edited by Bish, D. L. and Post, J. E. (Mineralogical Society of America, Chelsea), pp. 145182.CrossRefGoogle Scholar
Skipper, N. T., Refson, K., and McConnell, J. D. C. (1991). “Computer simulation of interlayer water in 2:1 clays,” J. Chem. Phys. JCPSA6 10.1063/1.460175 94, 74347445.CrossRefGoogle Scholar
Tettenhorst, R. and Reynolds, R. C. Jr. (1971). “Choice of origin and its effect on calculated X-ray spacings for thin montmorillonite crystals,” Am. Mineral. AMMIAY 56, 14771480.Google Scholar
Tettenhorst, R. and Roberson, H. E. (1973). “X-ray diffraction aspects of montmorillonites,” Am. Mineral. AMMIAY 58, 7380.Google Scholar
Viani, A., Gualtieri, A. F., and Artioli, G. (2002). “The nature of disorder in montmorillonite by simulation of X-ray powder patterns,” Am. Mineral. AMMIAY 87, 966975.CrossRefGoogle Scholar
Weaver, C. E. (1989). Clays, Muds, and Shales (Elsevier, Amsterdam), 819 pp.Google Scholar
Wright, A. C. (1973). “A compact representation for atomic scattering factors,” Clays Clay Miner. CLCMAB 21, 489490.CrossRefGoogle Scholar