Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-24T17:32:07.179Z Has data issue: false hasContentIssue false
  • English
  • Français

Developing a method for the evaluation of dislocation parameters from the Rietveld refinement procedure

Published online by Cambridge University Press:  10 June 2016

Saba Khalili ,
Vishtasb Soleimanian  and
Ali Mokhtari
Saba Khalili
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran
Vishtasb Soleimanian*
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran Nanotechnology Research Center, Shahrekord University, 8818634141 Shahrekord, Iran
Ali Mokhtari
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

In this investigation, the ability of Rietveld refinement method was used to simultaneously refine the structure and microstructure and evaluate the linear defects of cubic crystals. To do this, the basis of Stephans theory, about the anisotropic strain broadening, was developed and the values of dislocation density as well as the fraction of dislocation types were estimated. The reliability of this procedure was checked by selecting four different nanocrystaslline samples and evaluating the microstructure of these materials. Finally, the results were compared with those extracted from the whole powder pattern modeling method. Good agreement was achieved between the results of two methods.

Keywords

X-ray diffraction analysisRietveld refinementmicrostructuredislocation parameters
Type
Technical Articles
Information
Powder Diffraction , Volume 31 , Issue 3 , September 2016 , pp. 198 - 204
Check for updates
Copyright
Copyright © International Centre for Diffraction Data 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Attallah, M., Zabeen, S., Cernik, R. J., and Preuss, M. (2009). “Comparative determination of the a/b phase fraction in a+b-titanium alloys using X-ray diffraction and electron microscopy,” Mater. Charact. 60, 1248–1256.CrossRefGoogle Scholar
Cerny, R., Joubert, J. M., Latroche, M., Percheron, G. A., and Yvon, K. (2000). “Anisotropic diffraction peak broadening and dislocation substructure in hydrogen-cycled LaNi 5 and substitutional derivatives,” J. Appl. Crystallogr. 33, 997–1005.CrossRefGoogle Scholar
Dragomir, I. C. and Ungar, T. (2002). “Contrast factors of dislocations in the hexagonal crystal system,” J. Appl. Crystallogr. 35, 556–564.CrossRefGoogle Scholar
Ersching, K., Campos, C., Lima, J. C., Grandi, T., Souza, S., and Pizani, P. (2010). “X-ray diffraction, Raman and photoacoustic studies of InSb nanocrystals,” Mater. Chem. Phys. 122, 528–532.CrossRefGoogle Scholar
Ferrari, M. and Lutterotti, L. (1994). “Method for the simultaneous determination of anisotropic residual stresses and texture by x-ray diffraction,” J. Appl. Phys. 76, 7246.CrossRefGoogle Scholar
Leoni, M., Confente, T., and Scardi, P. (2006). “PM2 K: a flexible program implementing whole powder pattern modelling,” Z. Kristallogr. Suppl. 23, 249–254.CrossRefGoogle Scholar
Mojtahedi, M., Goodarzi, M., Aboutalebi, M. R., Ghaffari, M., and Soleimanian, V. (2013). “Investigation on the formation of Cu–Fe nano crystalline super-saturated solid solution developed by mechanical alloying,” J. Alloys Compd. 550, 380–388.CrossRefGoogle Scholar
Murugesan, S., Kuppusami, P., Mohandas, E., and Vijayalakshmi, M. (2012). “X-ray diffraction Rietveld analysis of cold worked austenitic stainless steel,” Mater. Lett. 67, 173–176.CrossRefGoogle Scholar
Rahaei, M. B. and Jia, D. (2014). “Processing behavior of nanocrystalline NiAl during milling, sintering and mechanical loading and interpretation of its intergranular fracture,” Eng. Fract. Mech. 132, 136–146.CrossRefGoogle Scholar
Rietveld, H. M. (1967). “Line profiles of neutron powder-diffraction peaks for structure refinement,” Acta Crystallogr. 22, 151–152.CrossRefGoogle Scholar
Rodriguez, C. J. (1990). “FULLPROF: a program for Rietveld refinement and pattern matching analysis,” in Abstracts of the Satellite Meeting on Powder Diffraction of the XV Congress of the IUCr, International Union of Crystallography, Toulouse, France, pp. 127.Google Scholar
Sarkar, A., Mukherjee, P., and Barat, P. (2008). “Effect of heavy ion irradiation on microstructure of zirconium alloy characterised by X-ray diffraction,” J. Nucl. Mater. 372, 285–292.CrossRefGoogle Scholar
Scardi, P. and Leoni, M. (2001). “Diffraction line profiles from polydisperse crystalline systems,” Acta Crystallogr. A 57, 604–613.CrossRefGoogle ScholarPubMed
Scardi, P. and Leoni, M. (2002). “Whole powder pattern modeling,” Acta Crystallogr. A 58, 190–200.CrossRefGoogle Scholar
Soleimanian, V. and Mojtahedi, M. (2015). “A comparison between different X-ray diffraction line broadening analysis methods for nanocrystalline ball-milled FCC powders,” Appl. Phys. A 119, 977–987.CrossRefGoogle Scholar
Soleimanian, V., Abedi, M., and Aghdaee, S. R. (2015). “Microstructure evaluation of nanocrystalline MgO powders using the advanced X-ray line profileanalysis,” J. Cryst. Growth 411, 4–11.CrossRefGoogle Scholar
Solovyov, L. A. (2000). “A correction for anisotropic line broadening due to structural defects in powder diffraction structure analysis,” J. Appl. Crystallogr. 33, 338–343.CrossRefGoogle Scholar
Stephens, P. W. (1999) “Phenomenological model of anisotropic peak broadening in powder diffraction,” J. Appl. Crystallogr. 32, 281–289.CrossRefGoogle Scholar
Ungar, T. and Tichy, G. (1999b). “The effect of dislocation contrast on X-ray line profiles in untextured polycrystals,” Phys. Status Solidi A 171, 425–434.3.0.CO;2-W>CrossRefGoogle Scholar
Ungar, T., Leoni, M., and Scardi, P. (1999a). “The dislocation model of strain anisotropy in whole powder-pattern fitting: the case of a Li–Mn cubic spinel,” J. Appl. Crystallogr. 32, 290–295.CrossRefGoogle Scholar
Ungar, T., Dragomir, I., Revesz, A., and Borbely, A. (1999c) “The contrast factors of dislocations in cubic crystals: the dislocation model of strainanisotropy in practice,” J. Appl. Crystallogr. 32, 992–1002.CrossRefGoogle Scholar
Warren, B. E. and Averbach, B. L. (1950). “The effect of cold-work distortion on X-ray patterns,” J. Appl. Phys. 21, 595–599.CrossRefGoogle Scholar
Wilkens, M. (1976). “Broadening of X-ray diffraction lines of crystals containing dislocation distributions,” Kristallogr. Tech. 11, 1159–1169.CrossRefGoogle Scholar
Williamson, G. K. and Hall, W. H. (1953). “X-ray line broadening from filed aluminium and wolfram,” Acta Metall. 1, 22–31.CrossRefGoogle Scholar
Williamson, G. K. and Smallman, R. E. (1956). “Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum” Philos. Mag. 1, 34–46.CrossRefGoogle Scholar
Wu, E., Gray, E. and MacA, K. E. H. (1998a). “Modelling dislocation-induced anisotropic line broadening in rietveld refinements using a Voigt function. I. General principles,” J. Appl. Crystallogr. 31, 356–362.CrossRefGoogle Scholar
Wu, E., Kisi, E. H. and Gray, E. M. (1998b). “Modelling dislocation-induced anisotropic line broadening in rietveld refinements using a Voigt function. II. Application to neutron powder diffraction data,” J. Appl. Crystallogr. 31, 363–368.CrossRefGoogle Scholar
Yahia, I. S., Salem, G. F., Abd, M. S., and Yakuphanoglu, F. “Optical properties of Al-CdO nano-clusters thin films,” Superlattice Microstruct. 64 (2013), 178–184.CrossRefGoogle Scholar
Zhang, Z., Jiang, C., Fu, P., Cai, F., and Ma, N. (2015). “Microstructure and texture of electrodeposited Ni–ZrC composite coatings investigated by Rietveld XRD line profile analysis,” J. Alloys Compd. 625, 118–123.CrossRefGoogle Scholar
Supplementary material: File

Khalili supplementary material S1

Khalili supplementary material

Download Khalili supplementary material S1(File)
File 3.7 KB
Supplementary material: File

Khalili supplementary material S4

Khalili supplementary material

Download Khalili supplementary material S4(File)
File 3.9 KB
Supplementary material: File

Khalili supplementary material S2

Khalili supplementary material

Download Khalili supplementary material S2(File)
File 3.9 KB
Supplementary material: File

Khalili supplementary material S3

Khalili supplementary material

Download Khalili supplementary material S3(File)
File 6 KB