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D-89 In-Situ HTXRD Characterization for Thin Films

Published online by Cambridge University Press:  20 May 2016

E. A. Payzant  and
S. A. Speakman
E. A. Payzant
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S. A. Speakman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 195
Copyright
Copyright © Cambridge University Press 2004

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