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D-2 Application of 2-Dimensional XRD for the Characterization of Microstructure of Self-Leveling Compounds (SLC)

Published online by Cambridge University Press:  20 May 2016

S. Seifert ,
J. Neubauer ,
F. Goetz-Neunhoeffer  and
H. Motzet
S. Seifert
Affiliation:
University of Erlangen-Nuremberg, Erlangen, Germany
J. Neubauer
Affiliation:
University of Erlangen-Nuremberg, Erlangen, Germany
F. Goetz-Neunhoeffer
Affiliation:
University of Erlangen-Nuremberg, Erlangen, Germany
H. Motzet
Affiliation:
Schoenox GmbH, Rosendahl, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 175
Copyright
Copyright © Cambridge University Press 2008

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