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Crystal structure and powder X-ray diffraction data for new Tb3CuAl3Ge2 compound

Published online by Cambridge University Press:  20 February 2015

Chao Zeng ,
Guoqiang Lin ,
Weijing Zeng  and
Wei He
Chao Zeng
Affiliation:
Guangxi International Business Vocational College, Nanning, Guangxi 530005, China
Guoqiang Lin
Affiliation:
Key Laboratory of New Processing Technology for Nonferrous Metal and Materials, Ministry of Education, Guangxi University, Nanning 530004, China
Weijing Zeng
Affiliation:
Key Laboratory of New Processing Technology for Nonferrous Metal and Materials, Ministry of Education, Guangxi University, Nanning 530004, China
Wei He*
Affiliation:
Key Laboratory of New Processing Technology for Nonferrous Metal and Materials, Ministry of Education, Guangxi University, Nanning 530004, China
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

The crystal structure of new Tb3CuAl3Ge2 quaternary compound was studied by the Rietveld method from powder X-ray diffraction (XRD) data. The Tb3CuAl3Ge2 compound crystallized in the hexagonal Y3NiAl3Ge2-type structure with space group P-62m (no. 189) and lattice parameters a = 7.0041(2) Å, c = 4.1775(1) Å, V = 177.48 Å3. There is only one formula in each unit cell, Z = 1, and the density of Tb3CuAl3Ge2 is ρx = 7.1696 g cm−3. The reliability factors characterizing the Rietveld refinement results are Rp = 6.43%, Rwp = 8.65%, RB = 4.81%, and RF = 4.09%, respectively. The powder XRD data of Tb3CuAl3Ge2 were presented and the reliability of indexation is F30 = 120.9(0.0073, 34).

Keywords

crystal structureTb3CuAl3Ge2powder X-ray diffraction
Type
New Diffraction Data
Information
Powder Diffraction , Volume 30 , Issue 1 , March 2015 , pp. 63 - 66
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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References

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