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C-12 Invited—Hard X-ray Full Field 3D Imaging with sub-50 nm Resolution

Published online by Cambridge University Press:  20 May 2016

A. Tkachuk ,
M. Feser ,
F. Duewer ,
J. Gelb ,
G. Hsu ,
S. Wang  and
W. Yun
A. Tkachuk
Affiliation:
Xradia, Inc., Concord, CA
M. Feser
Affiliation:
Xradia, Inc., Concord, CA
F. Duewer
Affiliation:
Xradia, Inc., Concord, CA
J. Gelb
Affiliation:
Xradia, Inc., Concord, CA
G. Hsu
Affiliation:
Xradia, Inc., Concord, CA
S. Wang
Affiliation:
Xradia, Inc., Concord, CA
W. Yun
Affiliation:
Xradia, Inc., Concord, CA
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 173
Copyright
Copyright © Cambridge University Press 2008

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