Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-23T08:40:54.215Z Has data issue: false hasContentIssue false

C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials

Published online by Cambridge University Press:  20 May 2016

F. A. Selim
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
D. P. Wells
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
J. F. Harmon
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
J. Kwofie
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)