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Angular Corrections for the Seemann-Bohlin X-Ray Diffractometer

Published online by Cambridge University Press:  10 January 2013

D. Rafaja  and
V. Valvoda
D. Rafaja
Affiliation:
Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czechoslovakia
V. Valvoda
Affiliation:
Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czechoslovakia
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Abstract

A method for the correction of peak position for the Seemann-Bohlin X-ray diffractometer, useful for practical application, is presented. The position of diffraction peaks is largely influenced by both the displacement of specimen from the diffractometer circle and the shift of the X-ray tube focus. The described correction method has been used for investigation of thin layers, especially for the precise determination of both lattice parameter and stresses in thin films. The application of the method is illustrated on samples of TiN and ZrN coatings deposited on steel substrates and additionally covered with a thin film of Si or Ta or TaC powder used as an internal standard.

Type
Research Article
Information
Powder Diffraction , Volume 6 , Issue 4 , December 1991 , pp. 200 - 203
Copyright
Copyright © Cambridge University Press 1991

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References

Bohlin, H. (1920). Ann. Phys. 61, 420.Google Scholar
Feder, R. & Berry, B.S. (1970). J. Appl. Crystallogr. 3, 372.CrossRefGoogle Scholar
Haase, E.L. (1985). Thin Solid Films 124, 283.Google Scholar
Mack, M. & Parrish, W. (1967). Acta. Crystallogr. 23, 693.CrossRefGoogle Scholar
Parrish, W. & Mack, M. (1967). Acta. Crystallogr. 23, 687.CrossRefGoogle Scholar
Seeman, H. (1919). Ann Phys. 59, 455.CrossRefGoogle Scholar
Valvoda, V., Kuzel, R., Cerný, R., Rafaja, D., Musil, J., Kadlec, S. & Perry, A.J. (1990). Thin Solid Films 193/194, 401.Google Scholar
Zevin, L.S. (1988). Pow. Diff. 3 (1), 25.Google Scholar