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An XRPD Investigation of a Face-Centered Cubic Metallic Plating

Published online by Cambridge University Press:  10 January 2013

Clay Olaf Ruud ,
Robin J. McDowell  and
Daniel J. Snoha
Clay Olaf Ruud
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
Robin J. McDowell
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
Daniel J. Snoha
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
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Abstract

Internal elastic strain (i.e., residual stress) and the diffracted X-ray intensity variation over several orientations of crystallites with respect to the specimen surface were investigated as a means of differentiating two qualities of polycrystalline nickel plating. A unique instrument based upon a position-sensitive scintillation X-ray detector was used to apply all of the techniques commonly applied to X-ray stress analysis in this investigation. It was concluded that residual stress measurements did not provide a clear distinction between the two specimens, but comparison of the relative intensities diffracted from crystallographic planes at certain orientations with the surface did provide a distinction.

Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 2 , June 1986 , pp. 22 - 27
Copyright
Copyright © Cambridge University Press 1986

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References

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